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"Integrated Circuits " CNS Standards List

C-Electrical Engineering
CNS 15748-4    2019 Edition
Integrated Circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method
積體電路-150 kHz 至1 GHz 電磁放射量測-第4 部:傳導放射量測-1Ω/150Ω直接耦合法積體電路-150 kHz 至1 GHz 電磁放射量測-第4 部:傳導放射量測-1Ω/150Ω直接耦合法
C-Electrical Engineering
CNS 15748-5    2019 Edition
Integrated Circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 5: Measurement of conducted emissions – Workbench Faraday Cage method
積體電路-150 kHz 至1 GHz 電磁放射量測-第5 部:傳導放射量測-工作台法拉第箱體法
C-Electrical Engineering
CNS 15748-3    2019 Edition
Integrated Circuits − Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 3: Measurement of radiated emissions – Surface scan method
積體電路-150 kHz 至1 GHz 電磁放射量測-第3 部:輻射放射量測-表面掃描法
C-Electrical Engineering
CNS 15748-2    2019 Edition
Integrated Circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz − Part 2: Measurement of radiated emissions − TEM cell and wideband TEM cell method
積體電路- 150 kHz 至1 GHz 電磁放射量測-第2 部: 輻射放射量測- 橫向電磁波室與寬頻橫向電磁波室法
C-Electrical Engineering
CNS 15748-1    2019 Edition
Integrated Circuits − Measurement of electromagnetic emissions, 150 kHz to 1 GHz − Part 1: General conditions and definitions
積體電路-150 kHz 至1 GHz 電磁放射量測-第1 部:一般條件及定義
C-Electrical Engineering
CNS 15748-6    2015 Edition
Integrated Circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method
積體電路-150 kHz 至1 GHz 電磁放射量測-第6 部:傳導放射量測-磁場探棒法
C-Electrical Engineering
CNS 15811-4    2015 Edition
Integrated Circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method
積體電路- 150 kHz 至1 GHz 電磁抗擾度量測- 第4 部: 射頻功率直接注入法
C-Electrical Engineering
CNS 15811-5    2015 Edition
Integrated Circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 5: Workbench Faraday cage method
積體電路- 150 kHz 至1 GHz 電磁抗擾度量測- 第5 部: 工作台法拉第箱體法
C-Electrical Engineering
CNS 15811-3    2015 Edition
Integrated Circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 3: Bulk current injection (BCI) method
積體電路-150 kHz 至1 GHz 電磁抗擾度量測-第3 部:大電流注入法
C-Electrical Engineering
CNS 15811-2    2015 Edition
Integrated Circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 2: Measurement of radiated immunity − TEM cell and wideband TEM cell method
積體電路-150 kHz 至1 GHz 電磁抗擾度量測-第2 部:輻射抗擾度量測-橫向電磁波室與寬頻橫向電磁波室法
C-Electrical Engineering
CNS 15811-5    2015 Edition
Integrated Circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 5: Workbench Faraday cage method
積體電路-150 kHz至1 GHz電磁抗擾度量測-第5部:工作台法拉第箱體法
C-Electrical Engineering
CNS 15811-4    2015 Edition
Integrated Circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method
積體電路-150 kHz至1 GHz電磁抗擾度量測-第4部:射頻功率直接注入法
C-Electrical Engineering
CNS 15811-3    2015 Edition
Integrated Circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 3: Bulk current injection (BCI) method
積體電路-150 kHz至1 GHz電磁抗擾度量測-第3部:大電流注入法
C-Electrical Engineering
CNS 15811-2    2015 Edition
Integrated Circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 2: Measurement of radiated immunity − TEM cell and wideband TEM cell method
積體電路-150 kHz至1 GHz電磁抗擾度量測-第2部:輻射抗擾度量測-橫向電磁波室與寬頻橫向電磁波室法
C-Electrical Engineering
CNS 15748-6    2015 Edition
Integrated Circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method
積體電路-150 kHz至1 GHz電磁放射量測-第6部:傳導放射量測-磁場探棒法

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