CNS Standards Solution | HOME | LOGIN | SIGN UP | CONTACT US | 中文版 |
�� ��

Chinese National Standards
中華民國國家標準
- Taiwan 台灣 -
 

"circuits " CNS Standards List

C-Electrical Engineering
CNS 15748-4    2019 Edition
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method
積體電路-150 kHz 至1 GHz 電磁放射量測-第4 部:傳導放射量測-1Ω/150Ω直接耦合法積體電路-150 kHz 至1 GHz 電磁放射量測-第4 部:傳導放射量測-1Ω/150Ω直接耦合法
C-Electrical Engineering
CNS 15748-5    2019 Edition
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 5: Measurement of conducted emissions – Workbench Faraday Cage method
積體電路-150 kHz 至1 GHz 電磁放射量測-第5 部:傳導放射量測-工作台法拉第箱體法
C-Electrical Engineering
CNS 15748-3    2019 Edition
Integrated circuits − Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 3: Measurement of radiated emissions – Surface scan method
積體電路-150 kHz 至1 GHz 電磁放射量測-第3 部:輻射放射量測-表面掃描法
C-Electrical Engineering
CNS 15748-2    2019 Edition
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz − Part 2: Measurement of radiated emissions − TEM cell and wideband TEM cell method
積體電路- 150 kHz 至1 GHz 電磁放射量測-第2 部: 輻射放射量測- 橫向電磁波室與寬頻橫向電磁波室法
C-Electrical Engineering
CNS 15748-1    2019 Edition
Integrated circuits − Measurement of electromagnetic emissions, 150 kHz to 1 GHz − Part 1: General conditions and definitions
積體電路-150 kHz 至1 GHz 電磁放射量測-第1 部:一般條件及定義
C-Electrical Engineering
CNS 15651-1    2018 Edition
Energy performance of lamp controlgear − Part 1: Controlgear for fluorescent lamps − Method of measurement to determine the total input power of controlgear circuits and the efficiency of the controlgear
光源控制裝置之能源效率-第1部: 螢光燈用控制裝置-光源-控制裝置電路 之總輸入功率與控制裝置效率之量測法
C-Electrical Engineering
CNS 14734    2017 Edition
Terms and definitions for printed circuits
印刷電路術語和定義
C-Electrical Engineering
CNS 6135-2    2017 Edition
Hearing aids-Part2: Hearing aids with automatic gain control circuits
助聽器-第2部:用自動增益控制電路的助聽器
C-Electrical Engineering
CNS 15748-6    2015 Edition
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method
積體電路-150 kHz 至1 GHz 電磁放射量測-第6 部:傳導放射量測-磁場探棒法
C-Electrical Engineering
CNS 15811-4    2015 Edition
Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method
積體電路- 150 kHz 至1 GHz 電磁抗擾度量測- 第4 部: 射頻功率直接注入法
C-Electrical Engineering
CNS 15811-5    2015 Edition
Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 5: Workbench Faraday cage method
積體電路- 150 kHz 至1 GHz 電磁抗擾度量測- 第5 部: 工作台法拉第箱體法
C-Electrical Engineering
CNS 15811-1    2015 Edition
Intergrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 1: General conditions and definitions
積體電路- 150 kHz 至1 GHz 電磁抗擾度量測- 第1 部: 一般條件及定義
C-Electrical Engineering
CNS 15811-3    2015 Edition
Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 3: Bulk current injection (BCI) method
積體電路-150 kHz 至1 GHz 電磁抗擾度量測-第3 部:大電流注入法
C-Electrical Engineering
CNS 15811-2    2015 Edition
Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 2: Measurement of radiated immunity − TEM cell and wideband TEM cell method
積體電路-150 kHz 至1 GHz 電磁抗擾度量測-第2 部:輻射抗擾度量測-橫向電磁波室與寬頻橫向電磁波室法
C-Electrical Engineering
CNS 15811-5    2015 Edition
Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 5: Workbench Faraday cage method
積體電路-150 kHz至1 GHz電磁抗擾度量測-第5部:工作台法拉第箱體法
C-Electrical Engineering
CNS 15748-6    2015 Edition
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method
積體電路-150 kHz至1 GHz電磁放射量測-第6部:傳導放射量測-磁場探棒法
C-Electrical Engineering
CNS 15811-1    2015 Edition
Intergrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 1: General conditions and definitions
積體電路-150 kHz至1 GHz電磁抗擾度量測-第1部:一般條件及定義
C-Electrical Engineering
CNS 15811-2    2015 Edition
Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 2: Measurement of radiated immunity − TEM cell and wideband TEM cell method
積體電路-150 kHz至1 GHz電磁抗擾度量測-第2部:輻射抗擾度量測-橫向電磁波室與寬頻橫向電磁波室法
C-Electrical Engineering
CNS 15811-3    2015 Edition
Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 3: Bulk current injection (BCI) method
積體電路-150 kHz至1 GHz電磁抗擾度量測-第3部:大電流注入法
C-Electrical Engineering
CNS 15811-4    2015 Edition
Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method
積體電路-150 kHz至1 GHz電磁抗擾度量測-第4部:射頻功率直接注入法
C-Electrical Engineering
CNS 14734    2003 Edition
Terms and definitions for printed circuits
印刷電路術語和定義
C-Electrical Engineering
CNS 6135-2    2000 Edition
Hearing aids-Part2: Hearing aids with automatic gain control circuits
助聽器-第2部:用自動增益控制電路的助聽器

Find out:22Items   |  To Page of: First -Previous-Next -Last  | 1

 

| HOME | LOGIN | SIGN UP | CONTACT US | 中文版 | ©  CNS-standards.org Copyright  2001-2025 All Rights Reserved
The authority agency link :
Bureau of Standards, Metrology & Inspection M.O.E.A.
This site is not affiliated with or endorsed by the BSMI or MOEA.