"roe " CNS Standards List |
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CNS 13725
1996 Edition Method of Nondestructive Test for Microelectronic Wire Bonds 微電子銲線之非破壞性拉力試驗法 |
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CNS 12865-10
1992 Edition Method of Test for Digital Microelectronics (Functional Testing) 數位微電子檢驗法（功能測試） |
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CNS 12865-1
1991 Edition Method of Test for Digital Microelectronics ( High Level Output Voltage ) 數位微電子檢驗法（高位準輸出電壓） |
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CNS 12865-9
1991 Edition Method of Test for Digital Microelectronics ( Delay Measurements ) 數位微電子檢驗法（延遲量測） |
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CNS 12865-8
1991 Edition Method of Test for Digital Microelectronics ( Load Condition ) 數位微電子檢驗法（負載條件） |
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CNS 12865-7
1991 Edition Method of Test for Digital Microelectronics ( Drive Source, Dynamic ) 數位微電子檢驗法（驅動源，動態） |
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CNS 12865-6
1991 Edition Method of Test for Digital Microelectronics ( Terminal Capacitance ) 數位微電子檢驗法（端子電容值） |
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CNS 12865-5
1991 Edition Method of Test for Digital Microelectronics ( Output Short Circuit Current ) 數位微電子檢驗法（輸出端短路電流） |
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CNS 12865-4
1991 Edition Method of Test for Digital Microelectronics ( High Level Input Current ) 數位微電子檢驗法（高位準輸入電流） |
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CNS 12865-3
1991 Edition Method of Test for Digital Microelectronics ( Low Level Input Current ) 數位微電子檢驗法（低位準輸入電流） |
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CNS 12865-2
1991 Edition Method of Test for Digital Microelectronics ( Low Level Output Voltage ) 數位微電子檢驗法（低位準輸出電壓） |
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