"Method " CNS Standards List| Type N1 | Marine Cast | IPv6 global | Core Plugs, | Maleic Anhydride | Multicolor paints | Gas cylinders | Method Test | |
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CNS 12845
1998 Edition Method of straight-beam ultrasonic test for structure-use steel plate 結構用鋼板超音波直束檢測法 |
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CNS 14181
1998 Edition Measurement Methods for the performance of analog video laser transmitter and receiver modules used for optical fiber communication 光纖通信用類比視訊雷射傳輸和接收模組之性能量測法 |
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CNS 1222
1997 Edition Method of doctor test for petroleum and petroleum products 石油及其產品之陶氏試驗法 |
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CNS 13999
1997 Edition General Methods of measuring the performances of ultrasonic pulse-echo diagnostic equipment 脈衝式反射法超音波診斷裝置檢驗法 |
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CNS 13807
1997 Edition Methods of Test of Epoxy for Light Emitting Diodes 發光二極體用環氧樹脂試驗法 |
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CNS 11785
1997 Edition Method of test for monitor 監視器檢驗法 |
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CNS 13804
1997 Edition Guidance on the Use of the Substitution Method for Measurements of Radiation from Microwave Ovens for Frequencies above 1 GHz 應用置換法測量微波爐1GHz以上之輻射指引 |
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CNS 4899
1997 Edition Test Methods of fixed resistors for use in electronic equipment 電子設備用固定電阻器檢驗法 |
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CNS 13806
1997 Edition Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes 發光二極體磊晶片發光波長與亮度量測法 |
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CNS 10760
1997 Edition Method of test for flammability of treated paper and paperboard 加工處理紙及紙板防焰性試驗 |
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CNS 11299-7
1997 Edition Glossary of terms for sensing and transducing (Terms of measurement Methods and equipment) 感測與轉換詞彙(有關量測方法與裝備名詞) |
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CNS 13805
1997 Edition Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers 光電半導體晶圓之光激光譜量測法 |
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CNS 13794
1996 Edition Measuring Methods of Optical Filter for Communication 通信用光濾波器量測法 |
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CNS 3552
1996 Edition General Rules of Physical Testing Methods for Vulcanized Rubber 硫化橡膠物理試驗法通則 |
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CNS 13727
1996 Edition Method of Test for Volume Resistivity of Conductive Adhesives 導電膠之體積電阻率量測法 |
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CNS 13779
1996 Edition Measuring Methods for Infrared Emitting Diodes (IRED)(for Automation) 自動控制用紅外發光二極體量測法 |
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CNS 13780
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test 自動控制用紅外發光二極體耐久性試驗法－連續通電試驗 |
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CNS 13725
1996 Edition Method of Nondestructive Test for Microelectronic Wire Bonds 微電子銲線之非破壞性拉力試驗法 |
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CNS 13724
1996 Edition Method of Test for Pull Strength of Microelectronic Wire Bonds 微電子銲線拉力試驗法 |
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CNS 11395
1996 Edition Method of Test for Stiffness of Paper and Paperboard(Taber Stiffness Tester) 紙及紙板剛度試驗法（Taber剛度試驗機） |
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CNS 13781
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias) 自動控制用紅外發光二極體耐久性試驗法－預燒試驗（順向偏壓） |
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CNS 13726
1996 Edition Method of Test for Shear Strength of Dil Bond 晶粒固著強度試驗法 |
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CNS 13654
1996 Edition Measuring Methods for Photodiode(for Communication) 通信用光二極體量測法 |
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CNS 9180
1996 Edition Methods of Test for Distillation of Chemical Products 化學製品蒸餾測定法 |
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CNS 13651
1996 Edition Measuring Methods for Light Emitting Diode(for Communication) 通信用發光二極體量測法 |
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CNS 8839
1996 Edition Methods of Test for Refractive Index of Chemical Products 化學製品折射率測定法 |
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CNS 8838
1996 Edition Methods of Test for Loss and Residue of Chemical Products 化學製品減量及殘留分測定法 |
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CNS 8837
1996 Edition Methods of Test for Optical Rotation of Chemical Products 化學製品旋光度測定法 |
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CNS 8836
1996 Edition Method of Test for Freezing Point of Chemical Products 化學製品凝固點測定法 |
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CNS 8835
1996 Edition Methods of Test for Melting Point and Melting Range of Chemical Products 化學製品熔點及熔融範圍測定法 |
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