"1, " CNS Standards List |
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CNS 13999
1997 Edition General methods of measuring the performances of ultrasonic pulse-echo diagnostic equipment 脈衝式反射法超音波診斷裝置檢驗法 |
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CNS 14102
1997 Edition Manual scanning B-mode ultrasonic diagnostic equipment 手動掃描Ｂ型超音波診斷裝置 |
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CNS 14101
1997 Edition A-mode ultrasonic diagnostic equipment Ａ型超音波診斷裝置 |
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CNS 13989-3
1997 Edition Glossary of terms for production automation and inventory management (Terms of production management) 生產自動化與庫存管理詞彙（有關生產管理之名詞） |
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CNS 13804
1997 Edition Guidance on the Use of the Substitution Method for Measurements of Radiation from Microwave Ovens for Frequencies above 1 GHz 應用置換法測量微波爐1GHz以上之輻射指引 |
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CNS 3471
1997 Edition PE-insulated pair type aluminium tape shield,PE-sheathed,telephone cable 聚乙烯絕緣鋁帶聚乙烯被覆市內對型電話電纜 |
Translated |
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CNS 3510
1997 Edition Copper and copper alloy covered electrodes 銅及銅合金被覆銲條 |
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CNS 3510-1
1997 Edition Copper and copper alloy gas welding rods 銅及銅合金氣銲條 |
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CNS 13622
1997 Edition Fixed chip resistor for use in electronic equipment 電子設備用固定晶片電阻器 |
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CNS 10760
1997 Edition Method of test for flammability of treated paper and paperboard 加工處理紙及紙板防焰性試驗 |
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CNS 13805
1997 Edition Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers 光電半導體晶圓之光激光譜量測法 |
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CNS 13806
1997 Edition Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes 發光二極體磊晶片發光波長與亮度量測法 |
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CNS 13807
1997 Edition Methods of Test of Epoxy for Light Emitting Diodes 發光二極體用環氧樹脂試驗法 |
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CNS 13808
1997 Edition Epitaxial Wafers for Light Emitting Diodes 發光二極體磊晶片 |
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CNS 13809
1997 Edition Light Emitting Diode Dice 發光二極體晶粒 |
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CNS 13810
1997 Edition Lead Frames for Light Emitting Diodes 發光二極體用支架 |
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CNS 13720
1996 Edition Micrographics-ISO Resolution Test Chart No 2-Description and Use 微縮技術－國際標準組織二號解像率測試卡－結構與應用 |
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CNS 8558
1996 Edition Aluminium Conductor Polyvinyl Chloride Insulated Service Drop Wires 鋁導體聚氯乙烯絕緣接戶線(A1-DV，ACSR-DV) |
Translated |
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CNS 13754
1996 Edition Corrosion of Metals and Alloys-Corrosivity of Atmospheres-Measurement of Pollution 金屬及合金之腐蝕－大氣腐蝕性(污染之測定) |
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CNS 13800
1996 Edition Photography-Processed Photographic Black-and-White Film for Archival Records-Silver-Gelatin Type on Poly (Ethylene Terephthalate) Base-Specification 照相技術－顯像處理完畢之存檔底片－銀鹽膠膜聚酯纖維片基底片－基本規格 |
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CNS 13801
1996 Edition Photography-Processed Photographic Black-and-White Film for Archival Records-Silver-Gelatin Type on Cellulose Ester Base-Specifications 照相技術－顯像處理完畢之存檔底片－銀鹽膠膜纖維素酯片基底片－基本規格 |
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CNS 13722
1996 Edition Documentation-Headers for Microfiche of Monographs and Serials 文獻－圖書與期刊的微縮單片標題 |
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CNS 13781
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias) 自動控制用紅外發光二極體耐久性試驗法－預燒試驗（順向偏壓） |
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CNS 13794
1996 Edition Measuring Methods of Optical Filter for Communication 通信用光濾波器量測法 |
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CNS 13724
1996 Edition Method of Test for Pull Strength of Microelectronic Wire Bonds 微電子銲線拉力試驗法 |
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CNS 13725
1996 Edition Method of Nondestructive Test for Microelectronic Wire Bonds 微電子銲線之非破壞性拉力試驗法 |
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CNS 13726
1996 Edition Method of Test for Shear Strength of Dil Bond 晶粒固著強度試驗法 |
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CNS 13727
1996 Edition Method of Test for Volume Resistivity of Conductive Adhesives 導電膠之體積電阻率量測法 |
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CNS 13656
1996 Edition Lot-Control Testing for Photodiode(for Communication) 通信用光二極體之批品質控制測試 |
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CNS 13780
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test 自動控制用紅外發光二極體耐久性試驗法－連續通電試驗 |
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