"Electron " CNS Standards List| 60° Center | Meter interface | Basic Rack | Method test | Power systems | Molybdenum steel | Iron ores—Method | Internal Pipings | |
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CNS 4899
1997 Edition Test methods of fixed resistors for use in Electronic equipment 電子設備用固定電阻器檢驗法 |
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CNS 13992
1997 Edition Fixed resistor networks in which not all resistors are individually measurable for use in Electronic equipment 電子設備用不可單獨量測所有電阻元件之固定網路電阻器 |
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CNS 13991
1997 Edition Fixed resistor networks with individually measurable resistors for use in Electronic equipment 電子設備用可單獨量測個別電阻元件之固定網路電阻器 |
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CNS 13805
1997 Edition Method of Measurement for Photoluminescence of OptoElectronic Semiconductor Wafers 光電半導體晶圓之光激光譜量測法 |
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CNS 13622
1997 Edition Fixed chip resistor for use in Electronic equipment 電子設備用固定晶片電阻器 |
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CNS 13725
1996 Edition Method of Nondestructive Test for MicroElectronic Wire Bonds 微電子銲線之非破壞性拉力試驗法 |
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CNS 13724
1996 Edition Method of Test for Pull Strength of MicroElectronic Wire Bonds 微電子銲線拉力試驗法 |
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CNS 4901
1994 Edition General Rules for Reliability Assured Electronic Components 可靠度保證電子零組件通則 |
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CNS 12211
1994 Edition Environmental Requirements for Electronic Components 電子零組件環境條件之分類 |
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CNS 3432
1994 Edition Method of Test of Fixed Capacitors for Use in Electronic Equipment 電子設備用固定電容器檢驗法 |
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CNS 4589
1994 Edition General Rules of Fixed Capacitors for Use in Electronic Equipment 電子設備用固定電容器通則 |
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CNS 9079
1994 Edition Color Code for Electronic Parts 電子零件色碼 |
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CNS 11475
1994 Edition General Rules for Electronic Components 電子零組件通則 |
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CNS 11476
1994 Edition General Test Procedure of Failure Rate for Electronic Components 電子零組件故障率試驗法通則 |
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CNS 13198
1993 Edition Fixed Multilayer Ceramic Chip Capacitors for Use in Electronic Equipment 電子設備用固定多層陶瓷晶片電容器 |
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CNS 4712
1993 Edition Method of Test for Digital Electronic Watches 數字電子錶檢驗法 |
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CNS 8942
1992 Edition Method of Test for Electronic Clocks `6rQuartz`6s 電子鐘檢驗法（石英振盪式） |
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CNS 12865-10
1992 Edition Method of Test for Digital MicroElectronics (Functional Testing) 數位微電子檢驗法（功能測試） |
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CNS 12865-4
1991 Edition Method of Test for Digital MicroElectronics ( High Level Input Current ) 數位微電子檢驗法（高位準輸入電流） |
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CNS 12865-8
1991 Edition Method of Test for Digital MicroElectronics ( Load Condition ) 數位微電子檢驗法（負載條件） |
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CNS 12865-9
1991 Edition Method of Test for Digital MicroElectronics ( Delay Measurements ) 數位微電子檢驗法（延遲量測） |
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CNS 12901
1991 Edition Digital Interconnection of Television Receivers and Electronic Equipment(8 pin) 電視接收機與數位周邊設備間之相互連接（8梢連接器） |
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CNS 12865-6
1991 Edition Method of Test for Digital MicroElectronics ( Terminal Capacitance ) 數位微電子檢驗法（端子電容值） |
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CNS 12865-5
1991 Edition Method of Test for Digital MicroElectronics ( Output Short Circuit Current ) 數位微電子檢驗法（輸出端短路電流） |
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CNS 12865-7
1991 Edition Method of Test for Digital MicroElectronics ( Drive Source, Dynamic ) 數位微電子檢驗法（驅動源，動態） |
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CNS 12865-1
1991 Edition Method of Test for Digital MicroElectronics ( High Level Output Voltage ) 數位微電子檢驗法（高位準輸出電壓） |
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CNS 12902
1991 Edition Analog Interconnection of Television Receivers and Electronic Equipment(21 pin) 電視接收機與類比周邊設備間之相互連接（21梢多梢連接器） |
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CNS 12865-3
1991 Edition Method of Test for Digital MicroElectronics ( Low Level Input Current ) 數位微電子檢驗法（低位準輸入電流） |
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CNS 12865-2
1991 Edition Method of Test for Digital MicroElectronics ( Low Level Output Voltage ) 數位微電子檢驗法（低位準輸出電壓） |
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CNS 12713
1990 Edition Machanical Structures for Electronic Equipment Terminology 電子裝置用機械構造名詞 |
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