"Method 5 " CNS Standards List| Method measurement | C11 Type | Frozen fish | Laminated Springs | Calculation Load | Identification Cards | Method test | Methods test | |
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CNS 12372
1988 Edition Method of Test for Fiber Optic Devices ( FOTP-53 Attenuation by Substitution Measurement for Multimode Graded-Index Optical Fibers or Fiber Assemblies Used in Long Length Communications System) 光纖裝置檢驗法（多模斜射率光纖或光纖組件在長距離通訊系統中衰減量之替代量測法FOTP-53） |
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CNS 12373
1988 Edition Method of Test for Fiber Optic Devices ( FOTP-58 Core Diameter Measurement of Graded-Index Optical Fibers ) 光纖裝置檢驗法（斜射率光纖纖核直徑之測量FOTP-58） |
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CNS 6150
1988 Edition Method of Test for Electromechanical Switches(Terminal Temperature Rise) 電機開關檢驗法－端子溫度上昇 |
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CNS 6151
1988 Edition Method of Test for Electromechanical Switches(Overload) 電機開關檢驗法－過負荷 |
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CNS 12358
1988 Edition Method of Test for Fiber Optic Devices (FOTP-63 Torsion Test) 光纖裝置檢驗法（扭力試驗FOTP-63） |
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CNS 11902
1987 Edition Method of Test for Fiber Optic Devices (FOTP-52 Temperature Dependence of Attenuation for Optical Fibers) 光纖裝置檢驗法（溫度變化對光纖衰減之影響FOTP-52） |
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CNS 5550
1987 Edition Method of Test for Thermistor 熱敏電阻器檢驗法 |
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CNS 11905
1987 Edition Method of Test for Fiber Optic Devices (FOTP-83 Cable to Interconnecting Device Axial Compressive Loading) 光纖裝置檢驗法（光纜至連接器之軸向壓力負載FOTP-83） |
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CNS 7664
1987 Edition Method of Test for Low Frequency (Below 3 MHz)Electrical Connectors (TP - 25 Probe Damage Test) 頻率3 MHz以下電連接器檢驗法(探針損壞試驗TP-25) |
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CNS 11993
1987 Edition Method of Test for Fiber Optic Devices (FOTP-50 Light-Launch Conditions for Long Length Graded-Index Optical Fiber Spectral Attenuation Measurement) 光纖裝置檢驗法（長距離斜射率光纖光譜衰減測量之光投射條件FOTP-50） |
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CNS 12085
1987 Edition Method of Test for Fiber Optic Devices (FOTP-54 Mode Scrambler Launch Requirements for Information Transmission Capacity Measurements) 光纖裝置檢驗法（資訊傳輸量測量之模攪拌器投射需求FOTP-54） |
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CNS 12086
1987 Edition Method of Test for Fiber Optic Devices (FOPT-55 Method for Measuring the Coating Geometry of Optical Fibers) 光纖裝置檢驗法（光纖鍍層幾何形狀之測量法FOTP-55） |
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CNS 10875
1987 Edition Method of Test for Fiber Optic Devices ( FOTP-4 Temperature Life Test ) 光纖裝置檢驗法（溫度壽命試驗FOTP-4） |
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CNS 8225
1987 Edition Method of Test for Dry Reed Switches (Quality Control and Quality Assurance Provisions) 乾式簧開關檢驗法（品質管制與品質保證規定） |
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CNS 12125
1987 Edition Method of Chemical Analysis for Nickel -Copper Alloy 鎳銅合金分析法 |
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CNS 5745
1987 Edition Method of test for Electrical Copper and Aluminium Wires 銅電線及鋁電線檢驗法 |
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CNS 8759
1987 Edition Method of Test for Bulk Specific Gravity of Compacted Bituminous Mixtures Using Saturated Surface-Dry Specimens 瀝青混合料壓實試體容積比重及密度試驗法（飽和面乾法） |
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CNS 9235
1987 Edition Method of Test for Dry Reed Switches(Application Notes) 乾式簧開關檢驗法（使用時注意事項） |
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CNS 8757
1987 Edition Method of Test for Bulk Specific Gravity and Density of Compacted Bituminous Mixtyres Using Paraffin- Coated Specimens 瀝青混合料壓實試體容積比重及密度試檢驗法（封臘法） |
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CNS 5555
1986 Edition Method of Test for Phonograph Rumbie 電唱機轆聲檢驗法 |
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CNS 7657
1986 Edition Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 7 Crimp Contact Deformation) 頻率3 MHz以下電連接器檢驗法(捲縮端子之變形TP-7) |
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CNS 11575
1986 Edition Method of Test for Low Frequency (Below 3MHz) Electrical Connectors (TP-55 Current Cycling Test) 頻率3 MHz以下電連接器檢驗法（電流循環試驗TP-55） |
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CNS 4762
1986 Edition Method of 5 Percent Sulfuric Acid Test for Stainless Steels 不銹鋼之５﹪硫酸腐蝕試驗法 |
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CNS 4765
1986 Edition Method of Nitric-Hydrofluoric Acid Test for Stainless Steels 不銹鋼之硝酸－氫氟酸腐蝕試驗法 |
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CNS 7658
1986 Edition Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 8 Crimp Tensile Strength) 頻率3 MHz以下電連接器檢驗法（捲縮端子之抗拉強度TP-8） |
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CNS 11521
1986 Edition Method for Making Anode Polarization Measurement for Stainless Steels 不銹鋼之陽極極化曲線測定法 |
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CNS 11576
1986 Edition Method for Fluorescent X-Ray Xnalysis of Ferroalloys 鐵合金之螢光Ｘ射線分析法 |
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CNS 11705
1986 Edition Method of Test for Fiber Devices (FOTP-20 Change of Optical Transmittance) 光纖組件檢驗法（透射率改變FOTP-20） |
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CNS 7659
1986 Edition Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 20 with Standing Voltage Test) 頻率3 MHz以下電連接器檢驗法（耐壓檢驗TP-20） |
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CNS 11573
1986 Edition Method of Test for Low Frequency (Below 3MHz) Electrical Connectors (TP-50 Sand and Dust Test) 頻率3 MHz以下電連接器檢驗法（細砂與塵埃試驗TP-50） |
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