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"Microelectronics" CNS Standards List

C-Electrical Engineering
CNS 12865-4    2017 Edition
Method of Test for Digital Microelectronics ( High Level Input Current )
數位微電子檢驗法(高位準輸入電流)
C-Electrical Engineering
CNS 12865-7    2017 Edition
Method of Test for Digital Microelectronics ( Drive Source, Dynamic )
數位微電子檢驗法(驅動源,動態)
C-Electrical Engineering
CNS 12865-3    2017 Edition
Method of Test for Digital Microelectronics ( Low Level Input Current )
數位微電子檢驗法(低位準輸入電流)
C-Electrical Engineering
CNS 12865-10    2017 Edition
Method of Test for Digital Microelectronics (Functional Testing)
數位微電子檢驗法(功能測試)
C-Electrical Engineering
CNS 12865-8    2017 Edition
Method of Test for Digital Microelectronics ( Load Condition )
數位微電子檢驗法(負載條件)
C-Electrical Engineering
CNS 12865-5    2017 Edition
Method of Test for Digital Microelectronics ( Output Short Circuit Current )
數位微電子檢驗法(輸出端短路電流)
C-Electrical Engineering
CNS 12865-1    2017 Edition
Method of Test for Digital Microelectronics ( High Level Output Voltage )
數位微電子檢驗法(高位準輸出電壓)
C-Electrical Engineering
CNS 12865-6    2017 Edition
Method of Test for Digital Microelectronics ( Terminal Capacitance )
數位微電子檢驗法(端子電容值)
C-Electrical Engineering
CNS 12865-2    2017 Edition
Method of Test for Digital Microelectronics ( Low Level Output Voltage )
數位微電子檢驗法(低位準輸出電壓)
C-Electrical Engineering
CNS 12865-9    2017 Edition
Method of Test for Digital Microelectronics ( Delay Measurements )
數位微電子檢驗法(延遲量測)
C-Electrical Engineering
CNS 12865-10    1992 Edition
Method of Test for Digital Microelectronics (Functional Testing)
數位微電子檢驗法(功能測試)
C-Electrical Engineering
CNS 12865-2    1991 Edition
Method of Test for Digital Microelectronics ( Low Level Output Voltage )
數位微電子檢驗法(低位準輸出電壓)
C-Electrical Engineering
CNS 12865-3    1991 Edition
Method of Test for Digital Microelectronics ( Low Level Input Current )
數位微電子檢驗法(低位準輸入電流)
C-Electrical Engineering
CNS 12865-4    1991 Edition
Method of Test for Digital Microelectronics ( High Level Input Current )
數位微電子檢驗法(高位準輸入電流)
C-Electrical Engineering
CNS 12865-5    1991 Edition
Method of Test for Digital Microelectronics ( Output Short Circuit Current )
數位微電子檢驗法(輸出端短路電流)
C-Electrical Engineering
CNS 12865-6    1991 Edition
Method of Test for Digital Microelectronics ( Terminal Capacitance )
數位微電子檢驗法(端子電容值)
C-Electrical Engineering
CNS 12865-7    1991 Edition
Method of Test for Digital Microelectronics ( Drive Source, Dynamic )
數位微電子檢驗法(驅動源,動態)
C-Electrical Engineering
CNS 12865-8    1991 Edition
Method of Test for Digital Microelectronics ( Load Condition )
數位微電子檢驗法(負載條件)
C-Electrical Engineering
CNS 12865-9    1991 Edition
Method of Test for Digital Microelectronics ( Delay Measurements )
數位微電子檢驗法(延遲量測)
C-Electrical Engineering
CNS 12865-1    1991 Edition
Method of Test for Digital Microelectronics ( High Level Output Voltage )
數位微電子檢驗法(高位準輸出電壓)

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