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"microelectronic" CNS Standards List

C-Electrical Engineering
CNS 12865-11    2019 Edition
Noise margin measurements for digital microelectronic devices
數位微電子量測法(雜訊邊限量測)
C-Electrical Engineering
CNS 12865-4    2017 Edition
Method of Test for Digital microelectronics ( High Level Input Current )
數位微電子檢驗法(高位準輸入電流)
C-Electrical Engineering
CNS 12865-7    2017 Edition
Method of Test for Digital microelectronics ( Drive Source, Dynamic )
數位微電子檢驗法(驅動源,動態)
C-Electrical Engineering
CNS 12865-3    2017 Edition
Method of Test for Digital microelectronics ( Low Level Input Current )
數位微電子檢驗法(低位準輸入電流)
C-Electrical Engineering
CNS 12865-10    2017 Edition
Method of Test for Digital microelectronics (Functional Testing)
數位微電子檢驗法(功能測試)
C-Electrical Engineering
CNS 12865-5    2017 Edition
Method of Test for Digital microelectronics ( Output Short Circuit Current )
數位微電子檢驗法(輸出端短路電流)
C-Electrical Engineering
CNS 12865-8    2017 Edition
Method of Test for Digital microelectronics ( Load Condition )
數位微電子檢驗法(負載條件)
C-Electrical Engineering
CNS 12865-1    2017 Edition
Method of Test for Digital microelectronics ( High Level Output Voltage )
數位微電子檢驗法(高位準輸出電壓)
C-Electrical Engineering
CNS 12865-6    2017 Edition
Method of Test for Digital microelectronics ( Terminal Capacitance )
數位微電子檢驗法(端子電容值)
C-Electrical Engineering
CNS 12865-2    2017 Edition
Method of Test for Digital microelectronics ( Low Level Output Voltage )
數位微電子檢驗法(低位準輸出電壓)
C-Electrical Engineering
CNS 12865-9    2017 Edition
Method of Test for Digital microelectronics ( Delay Measurements )
數位微電子檢驗法(延遲量測)
C-Electrical Engineering
CNS 13725    2017 Edition
Method of Nondestructive Test for microelectronic Wire Bonds
微電子銲線之非破壞性拉力試驗法
C-Electrical Engineering
CNS 13724    2017 Edition
Method of Test for Pull Strength of microelectronic Wire Bonds
微電子銲線拉力試驗法
C-Electrical Engineering
CNS 13725    1996 Edition
Method of Nondestructive Test for microelectronic Wire Bonds
微電子銲線之非破壞性拉力試驗法
C-Electrical Engineering
CNS 13724    1996 Edition
Method of Test for Pull Strength of microelectronic Wire Bonds
微電子銲線拉力試驗法
C-Electrical Engineering
CNS 12865-10    1992 Edition
Method of Test for Digital microelectronics (Functional Testing)
數位微電子檢驗法(功能測試)
C-Electrical Engineering
CNS 12865-2    1991 Edition
Method of Test for Digital microelectronics ( Low Level Output Voltage )
數位微電子檢驗法(低位準輸出電壓)
C-Electrical Engineering
CNS 12865-3    1991 Edition
Method of Test for Digital microelectronics ( Low Level Input Current )
數位微電子檢驗法(低位準輸入電流)
C-Electrical Engineering
CNS 12865-4    1991 Edition
Method of Test for Digital microelectronics ( High Level Input Current )
數位微電子檢驗法(高位準輸入電流)
C-Electrical Engineering
CNS 12865-5    1991 Edition
Method of Test for Digital microelectronics ( Output Short Circuit Current )
數位微電子檢驗法(輸出端短路電流)
C-Electrical Engineering
CNS 12865-6    1991 Edition
Method of Test for Digital microelectronics ( Terminal Capacitance )
數位微電子檢驗法(端子電容值)
C-Electrical Engineering
CNS 12865-7    1991 Edition
Method of Test for Digital microelectronics ( Drive Source, Dynamic )
數位微電子檢驗法(驅動源,動態)
C-Electrical Engineering
CNS 12865-8    1991 Edition
Method of Test for Digital microelectronics ( Load Condition )
數位微電子檢驗法(負載條件)
C-Electrical Engineering
CNS 12865-9    1991 Edition
Method of Test for Digital microelectronics ( Delay Measurements )
數位微電子檢驗法(延遲量測)
C-Electrical Engineering
CNS 12865-1    1991 Edition
Method of Test for Digital microelectronics ( High Level Output Voltage )
數位微電子檢驗法(高位準輸出電壓)

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