"Electrical Engineering " CNS Standards List |
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CNS 7966:1997
- English Version Polyestermide enamelled round copper winding wires 聚酯亞胺漆包銅線 - 英文版 |
Translated |
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CNS 13809:1997
- English Version Light Emitting Diode Dice 發光二極體晶粒 - 英文版 |
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CNS 3471:1997
- English Version PE-insulated pair type aluminium tape shield,PE-sheathed,telephone cable 聚乙烯絕緣鋁帶聚乙烯被覆市內對型電話電纜 - 英文版 |
Translated |
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CNS 13622:1997
- English Version Fixed chip resistor for use in electronic equipment 電子設備用固定晶片電阻器 - 英文版 |
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CNS 11785:1997
- English Version Method of test for monitor 監視器檢驗法 - 英文版 |
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CNS 13811:1997
- English Version Numerical-Type Reflectors for Light Emitting Diodes 發光二極體數字型反射套板 - 英文版 |
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CNS 13902:1997
- English Version Expression of the properties of cathode-ray oscilloscopes 陰極射線示波器特性 - 英文版 |
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CNS 13903:1997
- English Version Expression of the properties of storage cathode-ray oscilloscopes 儲存式陰極射線示波器特性 - 英文版 |
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CNS 13904:1997
- English Version Expression of the properties of sampling oscilloscopes 取樣示波器特性 - 英文版 |
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CNS 13991:1997
- English Version Fixed resistor networks with individually measurable resistors for use in electronic equipment 電子設備用可單獨量測個別電阻元件之固定網路電阻器 - 英文版 |
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CNS 13992:1997
- English Version Fixed resistor networks in which not all resistors are individually measurable for use in electronic equipment 電子設備用不可單獨量測所有電阻元件之固定網路電阻器 - 英文版 |
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CNS 4898:1997
- English Version Control cables 控制電纜 - 英文版 |
Translated |
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CNS 13808:1997
- English Version Epitaxial Wafers for Light Emitting Diodes 發光二極體磊晶片 - 英文版 |
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CNS 13782:1996
- English Version Realiability Assured Infrared Emitting Diodes (IRED)(for Automation) 自動控制用可靠度保證紅外發光二極體 - 英文版 |
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CNS 13656:1996
- English Version Lot-Control Testing for Photodiode(for Communication) 通信用光二極體之批品質控制測試 - 英文版 |
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CNS 13655:1996
- English Version Reliability Testing for Photodiode(for Communication) 通信用光二極體之可靠度測試 - 英文版 |
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CNS 13654:1996
- English Version Measuring Methods for Photodiode(for Communication) 通信用光二極體量測法 - 英文版 |
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CNS 13725:1996
- English Version Method of Nondestructive Test for Microelectronic Wire Bonds 微電子銲線之非破壞性拉力試驗法 - 英文版 |
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CNS 13726:1996
- English Version Method of Test for Shear Strength of Dil Bond 晶粒固著強度試驗法 - 英文版 |
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CNS 13653:1996
- English Version Lot-Control Testing for Light Emitting Diode(for Communication) 通信用發光二極體之批品質控制測試 - 英文版 |
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