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CNS 13781 Standard english version summary

 
CNS Chinese National Standard General No. CNS13781
Classified No. C6376
Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias)
自動控制用紅外發光二極體è€ä¹…性試驗法–é ç‡’試驗(順å‘å壓)
Date of Approval
Bureau of Standards, Metrology and Inspection Date of Revision
 
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CNS Standard Code CNS 13781
CNS Standard English Title Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias)
CNS Standard Chinese Title 自動控制用紅外發光二極體è€ä¹…性試驗法–é ç‡’試驗(順å‘å壓)
CNS Standard Classified No. C6376 - Electrical Engineering
CNS Standard Status Status:Current; Latest date:10/30/1996 Confirmed date:09/12/2017
Chinese Version Pages 1
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  • Relational CNS standards of CNS 13781     Keyword: Endurance Testing Methods Infrared Emitting Diodes Automation ...
  • Standard  Code
  • Standard Title
  • CNS 13780:2017
  • Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test
  • CNS 13781:2017
  • Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias)
  • CNS 13781:1996
  • Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias)
  • CNS 13780:1996
  • Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test
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