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CNS 15811-4 Standard english version summary

 
CNS Chinese National Standard General No. CNS15811-4
Classified No. C6457-4
Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method
積體電路-150 kHz至1 GHz電磁抗擾度量測-第4部:射頻功率直接注入法
Date of Approval
Bureau of Standards, Metrology and Inspection Date of Revision
 
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CNS Standard Code CNS 15811-4
CNS Standard English Title Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method
CNS Standard Chinese Title 積體電路-150 kHz至1 GHz電磁抗擾度量測-第4部:射頻功率直接注入法
CNS Standard Classified No. C6457-4 - Electrical Engineering
CNS Standard Status Current; Latest date:10/19/2015
Chinese Version Pages 19
Chinese Version Price $***.00 USD
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Translation Time About 5 Work Days

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  • Relational CNS standards of CNS 15811-4     Keyword: Integrated circuits Measurement electromagnetic immunity 150 kHz ...
  • Standard  Code
  • Standard Title
  • CNS 15748-4:2019
  • Integrated Circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method
  • CNS 15748-5:2019
  • Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 5: Measurement of conducted emissions – Workbench Faraday Cage method
  • CNS 15748-6:2015
  • Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method
  • CNS 15811-4:2015
  • Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method
  • CNS 15748-3:2019
  • Integrated circuits − Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 3: Measurement of radiated emissions – Surface scan method
  • CNS 15811-5:2015
  • Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 5: Workbench Faraday cage method
  • CNS 15748-2:2019
  • Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz − Part 2: Measurement of radiated emissions − TEM cell and wideband TEM cell method
  • CNS 15811-3:2015
  • Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 3: Bulk current injection (BCI) method
  • CNS 15748-1:2019
  • Integrated circuits − Measurement of electromagnetic emissions, 150 kHz to 1 GHz − Part 1: General conditions and definitions
  • CNS 15811-2:2015
  • Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 2: Measurement of radiated immunity − TEM cell and wideband TEM cell method
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