CNS Standards Solution | HOME | LOGIN | SIGN UP | CONTACT US | 中文版 |
¡¡ ¡¡

Chinese National Standards
中華民國國家標準
- Taiwan 台灣 -
 

CNS 7094 Standard english version summary

 
CNS Chinese National Standard General No. CNS7094
Classified No. Z8017
Method of Micro - Hardness Test for Vickers and Knoop Hardness
維克æ°åŠè«¾å¸ƒæ°é¡¯å¾®é¡ä¸‹ç¡¬åº¦è©¦é©—法
Date of Approval
Bureau of Standards, Metrology and Inspection Date of Revision
 
Thanks for your interest in "CNS 7094" standard !
1. If you only need this CNS7094 standard, you can pay directly on this page,
2. If you have more standards need to purchase, you can log in to the Member Center, put it in the shopping cart, and pay them together.

Add to cart

CNS Standard Code CNS 7094
CNS Standard English Title Method of Micro - Hardness Test for Vickers and Knoop Hardness
CNS Standard Chinese Title 維克æ°åŠè«¾å¸ƒæ°é¡¯å¾®é¡ä¸‹ç¡¬åº¦è©¦é©—法
CNS Standard Classified No. Z8017 - General & Miscellaneous
CNS Standard Status Status:Current; Latest date:07/11/1983 Confirmed date:11/19/2021
Chinese Version Pages 3
Chinese Version Price $***.00 USD
English Version Translate after your order
English Translation Price $***.00 USD
Translation Time About 5 Work Days

* Order Items    
* Payment Amount USD
* Email  
How to pay by credit or debit card?  
 
  • Relational CNS standards of CNS 7094     Keyword: Method Micro Hardness Test Vickers Knoop Hardness ...
  • Standard  Code
  • Standard Title
  • CNS 12865-4:2017
  • Method of Test for Digital Microelectronics ( High Level Input Current )
  • CNS 12865-3:2017
  • Method of Test for Digital Microelectronics ( Low Level Input Current )
  • CNS 12865-7:2017
  • Method of Test for Digital Microelectronics ( Drive Source, Dynamic )
  • CNS 15685:2019
  • Method of test for grain size of coated abrasive microgrits (P240-P2500)
  • CNS 12865-10:2017
  • Method of Test for Digital Microelectronics (Functional Testing)
  • CNS 12865-8:2017
  • Method of Test for Digital Microelectronics ( Load Condition )
  • CNS 12865-5:2017
  • Method of Test for Digital Microelectronics ( Output Short Circuit Current )
  • CNS 12865-1:2017
  • Method of Test for Digital Microelectronics ( High Level Output Voltage )
  • CNS 15676-3:2018
  • Interior air of road vehicles − Part 3: Screening method for the determination of the emissions of volatile organic compounds from vehicle interior parts and materials − Micro-scale chamber method
  • CNS 12865-6:2017
  • Method of Test for Digital Microelectronics ( Terminal Capacitance )
      >>>
    Order Process Chart

    Free sign up a member account, Log in the Member Center.
      

    Lookup the Standards you want to order.

    Add Standards in Shopping Cart,  you can add or delete standards in the Shopping Cart before you submit the Price Inquiry

    The Price Inquiry of the Standards order in your shopping cart will Submit to us automatically, We will quote within 24 hours. If in china work time, usually in 2 hr.

    Before Check out, you can delete the Standards you don't want to buy, then make the payment.

    Waiting for our Translation, the time is depend on the Standards pages, usually need 1 week.

    Download Standards PDF Files in this system or Sent to your email


    69 | HOME | LOGIN | SIGN UP | CONTACT US | 中文版 | ©  CNS-standards.org Copyright  2001-2025 All Rights Reserved
    The authority agency link :
    Bureau of Standards, Metrology & Inspection M.O.E.A.
    This site is not affiliated with or endorsed by the BSMI or MOEA.