"Diodes " CNS Standards List |
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CNS 13780
2017 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test 自動控制用紅外發光二極體耐久性試驗法–連續通電試驗 |
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CNS 11830
2017 Edition Measuring Methods for Light Emitting Diodes (for Indication) 發光二極體(指示用)測量法 |
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CNS 13808
2017 Edition Epitaxial Wafers for Light Emitting Diodes 發光二極體磊晶片 |
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CNS 13782
2017 Edition Realiability Assured Infrared Emitting Diodes (IRED)(for Automation) 自動控制用可靠度保證紅外發光二極體 |
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CNS 13806
2017 Edition Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes 發光二極體磊晶片發光波長與亮度量測法 |
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CNS 13807
2017 Edition Methods of Test of Epoxy for Light Emitting Diodes 發光二極體用環氧樹脂試驗法 |
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CNS 11829
2017 Edition Light Emitting Diodes (for Indication) 發光二極體(指示用) |
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CNS 13779
2017 Edition Measuring Methods for Infrared Emitting Diodes (IRED)(for Automation) 自動控制用紅外發光二極體量測法 |
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CNS 13781
2017 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias) 自動控制用紅外發光二極體耐久性試驗法–預燒試驗（順向偏壓） |
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CNS 13811
2017 Edition Numerical-Type Reflectors for Light Emitting Diodes 發光二極體數字型反射套板 |
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CNS 13810
2017 Edition Lead Frames for Light Emitting Diodes 發光二極體用支架 |
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CNS 13811
1997 Edition Numerical-Type Reflectors for Light Emitting Diodes 發光二極體數字型反射套板 |
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CNS 13806
1997 Edition Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes 發光二極體磊晶片發光波長與亮度量測法 |
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CNS 13807
1997 Edition Methods of Test of Epoxy for Light Emitting Diodes 發光二極體用環氧樹脂試驗法 |
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CNS 13808
1997 Edition Epitaxial Wafers for Light Emitting Diodes 發光二極體磊晶片 |
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CNS 13810
1997 Edition Lead Frames for Light Emitting Diodes 發光二極體用支架 |
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CNS 13779
1996 Edition Measuring Methods for Infrared Emitting Diodes (IRED)(for Automation) 自動控制用紅外發光二極體量測法 |
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CNS 13780
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test 自動控制用紅外發光二極體耐久性試驗法－連續通電試驗 |
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CNS 13781
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias) 自動控制用紅外發光二極體耐久性試驗法－預燒試驗（順向偏壓） |
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CNS 13782
1996 Edition Realiability Assured Infrared Emitting Diodes (IRED)(for Automation) 自動控制用可靠度保證紅外發光二極體 |
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CNS 11830
1987 Edition Measuring Methods for Light Emitting Diodes (for Indication) 發光二極體(指示用)測量法 |
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CNS 11829
1987 Edition Light Emitting Diodes (for Indication) 發光二極體(指示用) |
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