"Integrated circuits " CNS Standards List |
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CNS 15748-4
2019 Edition Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method 積體電路－150 kHz 至1 GHz 電磁放射量測－第4 部：傳導放射量測－1Ω/150Ω直接耦合法積體電路－150 kHz 至1 GHz 電磁放射量測－第4 部：傳導放射量測－1Ω/150Ω直接耦合法 |
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CNS 15748-5
2019 Edition Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 5: Measurement of conducted emissions – Workbench Faraday Cage method 積體電路－150 kHz 至1 GHz 電磁放射量測－第5 部：傳導放射量測－工作台法拉第箱體法 |
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CNS 15748-3
2019 Edition Integrated circuits − Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 3: Measurement of radiated emissions – Surface scan method 積體電路－150 kHz 至1 GHz 電磁放射量測－第3 部：輻射放射量測－表面掃描法 |
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CNS 15748-2
2019 Edition Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz − Part 2: Measurement of radiated emissions − TEM cell and wideband TEM cell method 積體電路－ 150 kHz 至1 GHz 電磁放射量測－第2 部： 輻射放射量測－ 橫向電磁波室與寬頻橫向電磁波室法 |
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CNS 15748-1
2019 Edition Integrated circuits − Measurement of electromagnetic emissions, 150 kHz to 1 GHz − Part 1: General conditions and definitions 積體電路－150 kHz 至1 GHz 電磁放射量測－第1 部：一般條件及定義 |
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CNS 15748-6
2015 Edition Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method 積體電路－150 kHz 至1 GHz 電磁放射量測－第6 部：傳導放射量測－磁場探棒法 |
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CNS 15811-4
2015 Edition Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method 積體電路－ 150 kHz 至1 GHz 電磁抗擾度量測－ 第4 部： 射頻功率直接注入法 |
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CNS 15811-5
2015 Edition Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 5: Workbench Faraday cage method 積體電路－ 150 kHz 至1 GHz 電磁抗擾度量測－ 第5 部： 工作台法拉第箱體法 |
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CNS 15811-3
2015 Edition Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 3: Bulk current injection (BCI) method 積體電路－150 kHz 至1 GHz 電磁抗擾度量測－第3 部：大電流注入法 |
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CNS 15811-2
2015 Edition Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 2: Measurement of radiated immunity − TEM cell and wideband TEM cell method 積體電路－150 kHz 至1 GHz 電磁抗擾度量測－第2 部：輻射抗擾度量測－橫向電磁波室與寬頻橫向電磁波室法 |
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CNS 15811-5
2015 Edition Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 5: Workbench Faraday cage method 積體電路－150 kHz至1 GHz電磁抗擾度量測－第5部：工作台法拉第箱體法 |
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CNS 15811-4
2015 Edition Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method 積體電路－150 kHz至1 GHz電磁抗擾度量測－第4部：射頻功率直接注入法 |
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CNS 15811-3
2015 Edition Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 3: Bulk current injection (BCI) method 積體電路－150 kHz至1 GHz電磁抗擾度量測－第3部：大電流注入法 |
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CNS 15811-2
2015 Edition Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 2: Measurement of radiated immunity − TEM cell and wideband TEM cell method 積體電路－150 kHz至1 GHz電磁抗擾度量測－第2部：輻射抗擾度量測－橫向電磁波室與寬頻橫向電磁波室法 |
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CNS 15748-6
2015 Edition Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method 積體電路－150 kHz至1 GHz電磁放射量測－第6部：傳導放射量測－磁場探棒法 |
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