"Diode " CNS Standards List |
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CNS 13779
2017 Edition Measuring Methods for Infrared Emitting Diodes (IRED)(for Automation) 自動控制用紅外發光二極體量測法 |
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CNS 13781
2017 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias) 自動控制用紅外發光二極體耐久性試驗法–預燒試驗（順向偏壓） |
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CNS 13650
2017 Edition Lot-Control Testing for Laser Diode(for Communication) 通信用雷射二極體之批品質控制測試 |
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CNS 13652
2017 Edition Reliability Testing for Light Emitting Diode(for Communication) 通信用發光二極體之可靠度測試 |
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CNS 13651
2017 Edition Measuring Methods for Light Emitting Diode(for Communication) 通信用發光二極體量測法 |
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CNS 13810
2017 Edition Lead Frames for Light Emitting Diodes 發光二極體用支架 |
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CNS 13811
2017 Edition Numerical-Type Reflectors for Light Emitting Diodes 發光二極體數字型反射套板 |
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CNS 13655
2017 Edition Reliability Testing for PhotoDiode(for Communication) 通信用光二極體之可靠度測試 |
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CNS 13654
2017 Edition Measuring Methods for PhotoDiode(for Communication) 通信用光二極體量測法 |
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CNS 13809
2017 Edition Light Emitting Diode Dice 發光二極體晶粒 |
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CNS 13649
2017 Edition Reliability Testing for Laser Diode(for Communication) 通信用雷射二極體之可靠度測試 |
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CNS 15233
2012 Edition Fixtures of roadway lighting with light emitting Diode lamps 發光二極體道路照明燈具 |
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CNS 13811
1997 Edition Numerical-Type Reflectors for Light Emitting Diodes 發光二極體數字型反射套板 |
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CNS 13810
1997 Edition Lead Frames for Light Emitting Diodes 發光二極體用支架 |
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CNS 13809
1997 Edition Light Emitting Diode Dice 發光二極體晶粒 |
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CNS 13808
1997 Edition Epitaxial Wafers for Light Emitting Diodes 發光二極體磊晶片 |
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CNS 13807
1997 Edition Methods of Test of Epoxy for Light Emitting Diodes 發光二極體用環氧樹脂試驗法 |
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CNS 13806
1997 Edition Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes 發光二極體磊晶片發光波長與亮度量測法 |
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CNS 13650
1996 Edition Lot-Control Testing for Laser Diode(for Communication) 通信用雷射二極體之批品質控制測試 |
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CNS 13648
1996 Edition Measuring Methods for Laser Diode(for Communication) 通信用雷射二極體量測法 |
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CNS 13651
1996 Edition Measuring Methods for Light Emitting Diode(for Communication) 通信用發光二極體量測法 |
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CNS 13780
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test 自動控制用紅外發光二極體耐久性試驗法－連續通電試驗 |
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CNS 13649
1996 Edition Reliability Testing for Laser Diode(for Communication) 通信用雷射二極體之可靠度測試 |
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CNS 13653
1996 Edition Lot-Control Testing for Light Emitting Diode(for Communication) 通信用發光二極體之批品質控制測試 |
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CNS 13655
1996 Edition Reliability Testing for PhotoDiode(for Communication) 通信用光二極體之可靠度測試 |
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CNS 13656
1996 Edition Lot-Control Testing for PhotoDiode(for Communication) 通信用光二極體之批品質控制測試 |
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CNS 13654
1996 Edition Measuring Methods for PhotoDiode(for Communication) 通信用光二極體量測法 |
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CNS 13779
1996 Edition Measuring Methods for Infrared Emitting Diodes (IRED)(for Automation) 自動控制用紅外發光二極體量測法 |
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CNS 13782
1996 Edition Realiability Assured Infrared Emitting Diodes (IRED)(for Automation) 自動控制用可靠度保證紅外發光二極體 |
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CNS 13781
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias) 自動控制用紅外發光二極體耐久性試驗法－預燒試驗（順向偏壓） |
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