"levels " CNS Standards List| Method test | Silicon Sand | GX16t 5 | Information technology | Static electricity | Short Pitch | Ductile Cast | Miniature fuses | |
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CNS 14654
2002 Edition Acoustics - Determination of sound power levels of noise sources using sound pressure - Precision methods for reverberation rooms 聲學－利用聲壓測定噪音源聲功率位準－迴響室的精密級方法 |
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CNS 14655-1
2002 Edition Acoustics - Determination of sound power levels of noise sources - Engineering methods for small, movable sources in reverberant fields - Part1: Comparison method for hard - walled test rooms 聲學－測定噪音源聲功率位準的工程級方法－用於迴響聲場小型、可移動的聲源－第一部：硬牆測試室的比較法 |
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CNS 14655-2
2002 Edition Acoustics - Determination of sound power levels of noise sources using sound pressure - Engineering methods for small, movable sources in reverberant fields - Part2: Method for special reverberation test rooms 聲學－利用聲壓測定噪音源聲功率位準的工程級方法－用於迴響聲場小型、可移動的聲源－第二部：特殊迴響測試室的方法 |
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CNS 14656
2002 Edition Acoustics - Determination of sound power levels of noise sources using sound pressure - Engineering method in an essentially free field over a reflecting plane 聲學－測定噪音源聲功率位準的工程級方法－用於一反射平面上的自由聲場條件 |
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CNS 14657
2002 Edition Acoustics - Determination of sound power levels of noise sources - Precision methods for anechoic and semi-anechoic rooms 聲學－測定噪音源聲功率位準的精密級方法－用於無響室和半無響室 |
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CNS 14658
2002 Edition Acoustics - Determination of sound power levels of noise sources using sound pressure - Survey method using an enveloping measurement surface over a reflecting plane 聲學－測定噪音源聲功率位準的評估級方法－使用在一反射平面上之包封量測表面 |
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CNS 14659
2002 Edition Acoustics - Determination of sound power levels of noise sources using sound pressure - Comparison method in situ 聲學－利用聲壓測定噪音源聲功率位準－現場的比較法 |
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CNS 14660-1
2002 Edition Acoustics - Determination of sound power levels of noise sources using sound intensity - Part 1: Measurement at discrete points 聲學－利用聲強測定噪音源聲功率位準－第一部：在非連續點的量測 |
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CNS 14660-2
2002 Edition Acoustics - Determination of sound power levels of noise source using sound intensity - Part 2: Measurement by scanning 聲學－利用聲強測定噪音源聲功率位準－第二部：掃描量測 |
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