"TA " CNS Standards List |
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CNS 11764
1991 Edition Magnetic Sound Recording Reference TApes 磁性錄音標準帶 |
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CNS 3292
1991 Edition Classification STAndard for Iron and Steel Scraps 鋼鐵廢料分類 |
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CNS 12865-9
1991 Edition Method of Test for DigiTAl Microelectronics ( Delay Measurements ) 數位微電子檢驗法（延遲量測） |
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CNS 12865-1
1991 Edition Method of Test for DigiTAl Microelectronics ( High Level Output Voltage ) 數位微電子檢驗法（高位準輸出電壓） |
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CNS 6619
1991 Edition Dentistry - Alloys for DenTAl Amalgam 牙科用汞齊合金 |
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CNS 12865-2
1991 Edition Method of Test for DigiTAl Microelectronics ( Low Level Output Voltage ) 數位微電子檢驗法（低位準輸出電壓） |
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CNS 216
1991 Edition Morse TAper Shank Drills （莫氏）推拔柄鑽頭 |
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CNS 12865-3
1991 Edition Method of Test for DigiTAl Microelectronics ( Low Level Input Current ) 數位微電子檢驗法（低位準輸入電流） |
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CNS 12865-4
1991 Edition Method of Test for DigiTAl Microelectronics ( High Level Input Current ) 數位微電子檢驗法（高位準輸入電流） |
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CNS 12865-5
1991 Edition Method of Test for DigiTAl Microelectronics ( Output Short Circuit Current ) 數位微電子檢驗法（輸出端短路電流） |
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CNS 12865-8
1991 Edition Method of Test for DigiTAl Microelectronics ( Load Condition ) 數位微電子檢驗法（負載條件） |
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CNS 12865-7
1991 Edition Method of Test for DigiTAl Microelectronics ( Drive Source, Dynamic ) 數位微電子檢驗法（驅動源，動態） |
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CNS 12866
1991 Edition Basic EnvironmenTAl Testing Procedures Part 2 : Tests-Test Z/AM : Combined Cold/Low Air Pressure Tests 環境試驗法（電氣、電子）－低溫／低氣壓複合試驗法 |
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CNS 12867
1991 Edition Basic EnvironmenTAl Testing Procedures Part 2 : Tests-Test Z/AM : Combined Dry Heat/Low Air Pressure Tests 環境試驗法（電氣、電子）－高溫／低氣壓複合試驗法 |
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CNS 218
1991 Edition Counter-boring Drill with Morse TAper Shank （莫氏）推拔柄柱坑鑽頭 |
Translated |
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CNS 12882
1991 Edition Method of Test for Hook Drawing ResisTAnce of Cement Sack Paper Laminated with Plastic Woven Sheet 塑膠編織貼合水泥袋紙鈎裂強度試驗法 |
Translated |
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CNS 221
1991 Edition Large Morse TAper Shank Drills 較大（莫氏）推拔柄鑽頭 |
Translated |
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CNS 12901
1991 Edition DigiTAl Interconnection of Television Receivers and Electronic Equipment(8 pin) 電視接收機與數位周邊設備間之相互連接（8梢連接器） |
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CNS 12865-6
1991 Edition Method of Test for DigiTAl Microelectronics ( Terminal Capacitance ) 數位微電子檢驗法（端子電容值） |
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CNS 12817
1990 Edition Basic EnvironmenTAl Testing Procedures Part 2 : Tests, Test XA and Guidance : Immersion in Cleaning Solvents 環境試驗法（電氣、電子）－耐溶劑性（浸漬）試驗法 |
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CNS 210
1990 Edition Short Drills with Square TAper Shank 方錐柄短鑽頭 |
Translated |
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CNS 12815
1990 Edition Helical-Scan Video TApe Cassette System Using 12.65 mm (0.5 in) Magnetic Tape on Type Beta Format β方式12.65 mm (0.5 in)磁帶螺線掃描視頻卡式磁帶系統 |
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CNS 209
1990 Edition Long Drills with Square TAper Shank 方錐柄長鑽頭 |
Translated |
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CNS 11234
1990 Edition Basic EnvironmenTAl Testing Procedures - Part 2 : Tests, Test Ea : Shock 環境試驗方法(電氣、電子)－衝擊試驗方法 |
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CNS 12663
1990 Edition Method of Test for Radiographic and Classification of Radiographs for TiTAnium Welds 鈦熔接縫放射線透射試驗法及透射照片之等級分類 |
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CNS 3628
1990 Edition Basic EnvironmenTAl Testing Procedures Part 2 : Tests, Test U : Robustness of Terminations and Integral Mounting Devices 環境試驗法（電氣、電子）－端子強度試驗法 |
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CNS 5198
1990 Edition High Insulation ResisTAnce Meters 高絕緣電阻計 |
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CNS 12671
1990 Edition Method of Test for Radiographic and Classification of Radiographs for STAinless Steel Welds 不銹鋼熔接縫放射線透射試驗法及透射照片之等級分類 |
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CNS 12714
1990 Edition Binary Direct VolTAge Signals for Process Measurement and Control Systems 程序測量及控制系統之二進位直流電壓信號 |
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CNS 7227
1990 Edition High VolTAge Ceramic Dielectric Capacitor, Class 2 第二類高壓陶質電容器 |
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