"1,3 " CNS Standards List |
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CNS 13720
1996 Edition Micrographics-ISO Resolution Test Chart No 2-Description and Use 微縮技術－國際標準組織二號解像率測試卡－結構與應用 |
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CNS 13106
1996 Edition Methods of Test for Water Content of Chemical Products 化學製品水分測定法 |
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CNS 13792
1996 Edition Measuring Methods of Optical Polarizer for Communication 通信用光極化器量測法 |
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CNS 13800
1996 Edition Photography-Processed Photographic Black-and-White Film for Archival Records-Silver-Gelatin Type on Poly (Ethylene Terephthalate) Base-Specification 照相技術－顯像處理完畢之存檔底片－銀鹽膠膜聚酯纖維片基底片－基本規格 |
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CNS 13794
1996 Edition Measuring Methods of Optical Filter for Communication 通信用光濾波器量測法 |
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CNS 13791
1996 Edition Measuring Methods of Optical Attenuator for Communication 通信用光衰減器量測法 |
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CNS 13793
1996 Edition Measuring Methods of Optical Isolators for Communication 通信用光隔離器量測法 |
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CNS 13782
1996 Edition Realiability Assured Infrared Emitting Diodes (IRED)(for Automation) 自動控制用可靠度保證紅外發光二極體 |
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CNS 12937
1996 Edition Structure of Welded SteelTanks for Petroleum Oil Storage 鋼製全熔接石油類儲槽構造 |
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CNS 13781
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias) 自動控制用紅外發光二極體耐久性試驗法－預燒試驗（順向偏壓） |
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CNS 13722
1996 Edition Documentation-Headers for Microfiche of Monographs and Serials 文獻－圖書與期刊的微縮單片標題 |
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CNS 13726
1996 Edition Method of Test for Shear Strength of Dil Bond 晶粒固著強度試驗法 |
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CNS 13780
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test 自動控制用紅外發光二極體耐久性試驗法－連續通電試驗 |
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CNS 13725
1996 Edition Method of Nondestructive Test for Microelectronic Wire Bonds 微電子銲線之非破壞性拉力試驗法 |
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CNS 13754
1996 Edition Corrosion of Metals and Alloys-Corrosivity of Atmospheres-Measurement of Pollution 金屬及合金之腐蝕－大氣腐蝕性(污染之測定) |
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CNS 13779
1996 Edition Measuring Methods for Infrared Emitting Diodes (IRED)(for Automation) 自動控制用紅外發光二極體量測法 |
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CNS 13790
1996 Edition Measuring Methods of Fiber Optical Branching Components for Communication 通信用光分歧元件量測法 |
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CNS 13504
1995 Edition Magnesium Ingots 鎂錠 |
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CNS 13521
1995 Edition Method of Test of Sacrificial Anodes Used for Cathodic Protection 陰極防蝕用犧牲陽極性能檢驗法 |
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CNS 13505
1995 Edition Methods of Chemical Analysis for Magnesium Metal 鎂錠分析法 |
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CNS 13625
1995 Edition Product Specifications for Round Polished Monocrystalline Gallium Arsenide Wafers 圓形砷化鎵單晶片產品標準 |
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CNS 13624
1995 Edition Test Methods for Crystallographic Perfection of Gallium Arsenside by Molten Potassium Hydroxide(KOH)Etch Technique 砷化鎵晶體結晶完整性檢驗法（熔融氫氧化鉀浸蝕法） |
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CNS 13495
1995 Edition Test Code for Performance of Machining Centers (Vertical Type) 立式切削中心機動態檢驗法 |
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CNS 13567
1995 Edition Method of Test for Sieving of Chemical Products 化學製品篩分法 |
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CNS 7381
1995 Edition Alloy Steel Tubes for Boiler and Heat Exchanger 鍋爐及熱交換器用合金鋼鋼管 |
Translated |
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CNS 1367
1995 Edition Tinned Hard-drawn Stranded Copper Wires 鍍錫硬銅絞電線 |
Translated |
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CNS 13623
1995 Edition Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method) 單晶片之電阻率、霍爾係數及霍爾移動率之測定法（范德普法） |
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CNS 12743
1995 Edition Butterfly Valves for Water Works (Wafer Type) 水道用蝶型閥（薄體型） |
Translated |
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CNS 3622
1995 Edition Basic Environmental Testing Procedures Part 1:General and Guidance 環境試驗法（電氣、電子）通則 |
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CNS 13518
1995 Edition Magnesium Alloys used as Sacrificial Anodes for Cathodic Protection 陰極防蝕用鎂合金犧牲陽極 |
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