" Test " CNS Standards List |
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CNS 8837
1996 Edition Methods of Test for Optical Rotation of Chemical Products 化學製品旋光度測定法 |
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CNS 11395
1996 Edition Method of Test for Stiffness of Paper and Paperboard(Taber Stiffness Tester) 紙及紙板剛度試驗法（Taber剛度試驗機） |
Translated |
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CNS 13106
1996 Edition Methods of Test for Water Content of Chemical Products 化學製品水分測定法 |
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CNS 13652
1996 Edition Reliability Testing for Light Emitting Diode(for Communication) 通信用發光二極體之可靠度測試 |
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CNS 13656
1996 Edition Lot-Control Testing for Photodiode(for Communication) 通信用光二極體之批品質控制測試 |
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CNS 3552
1996 Edition General Rules of Physical Testing Methods for Vulcanized Rubber 硫化橡膠物理試驗法通則 |
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CNS 13649
1996 Edition Reliability Testing for Laser Diode(for Communication) 通信用雷射二極體之可靠度測試 |
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CNS 8838
1996 Edition Methods of Test for Loss and Residue of Chemical Products 化學製品減量及殘留分測定法 |
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CNS 13653
1996 Edition Lot-Control Testing for Light Emitting Diode(for Communication) 通信用發光二極體之批品質控制測試 |
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CNS 9684
1996 Edition Method of Test for Rigid Steel Conduits 電線用鋼管檢驗法 |
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CNS 8836
1996 Edition Method of Test for Freezing Point of Chemical Products 化學製品凝固點測定法 |
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CNS 8834
1996 Edition Methods of Test for Density and Relative Density (Specific Gravity) of Chemical Products 化學製品密度及比重測定法 |
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CNS 13780
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test 自動控制用紅外發光二極體耐久性試驗法－連續通電試驗 |
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CNS 13655
1996 Edition Reliability Testing for Photodiode(for Communication) 通信用光二極體之可靠度測試 |
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CNS 13650
1996 Edition Lot-Control Testing for Laser Diode(for Communication) 通信用雷射二極體之批品質控制測試 |
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CNS 9180
1996 Edition Methods of Test for Distillation of Chemical Products 化學製品蒸餾測定法 |
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CNS 9564
1996 Edition Test Code for Accuracy of Single Spindle Automatic Lathes (Fixed Headstock Type) 單軸自動車床（車頭固定型）精度檢驗 |
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CNS 8835
1996 Edition Methods of Test for Melting Point and Melting Range of Chemical Products 化學製品熔點及熔融範圍測定法 |
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CNS 10227
1995 Edition Test Code for Accuracy of Glue Spreaders 佈膠機精度檢驗 |
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CNS 13623
1995 Edition Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method) 單晶片之電阻率、霍爾係數及霍爾移動率之測定法（范德普法） |
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CNS 10788
1995 Edition Test Code for Performance of Glue Spreaders 佈膠機動態檢驗法 |
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CNS 10228
1995 Edition Test Code for Accuracy of Scrapers 合板刨光機精度檢驗 |
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CNS 10471-1
1995 Edition Method of Test for Dirt in Paper and Paperboard 紙及紙板內污點試驗法 |
Translated |
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CNS 13624
1995 Edition Test Methods for Crystallographic Perfection of Gallium Arsenside by Molten Potassium Hydroxide(KOH)Etch Technique 砷化鎵晶體結晶完整性檢驗法（熔融氫氧化鉀浸蝕法） |
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CNS 10471
1995 Edition Method of Test for Dirt in Pulp 紙漿內污點試驗法 |
Translated |
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CNS 13543
1995 Edition Method of Test for Low-voltage Metal-enclosed Switchgear 低電壓金屬閉鎖型配電箱檢驗法 |
Translated |
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CNS 13521
1995 Edition Method of Test of Sacrificial Anodes Used for Cathodic Protection 陰極防蝕用犧牲陽極性能檢驗法 |
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CNS 9563
1995 Edition Test Code for Performance of Single Spindle Automatic Lathes(Fixed Headstock Type) 單軸自動車床（車頭固定型）動態檢驗法 |
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CNS 11050
1995 Edition General Rules for Eddy Current Testing 渦電流檢測法通則 |
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CNS 11401
1995 Edition Method of Ultrasonic Test for Steel Butt Welds 鋼對接銲道超音波檢測法 |
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