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中華民國國家標準
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"2 " CNS Standards List

C-Electrical Engineering
CNS 13214    2017 Edition
Basic Environmental Testing Procedures Part 2: Tests – Test Ec: Drop and Topple, Primarily for Equipment - type Specimens
環境試驗法(電氣、電子)–面落下、角落下及翻倒(主要為設備)試驗法
B-Mechanical Engineering
CNS 4428    2017 Edition
Hexagon Nuts, Rounded Trapezoidal Thread
六角螺帽(圓角梯形螺紋)
G-Ferrous Materials & Metallurgy
CNS 9276    2017 Edition
Cold finished carbon and alloy steel bars
光面鋼棒(碳鋼及合金鋼)
K-Chemical Industry
CNS 2228-2    2017 Edition
Plastics − Poly (methyl methacrylate) sheets − Types, dimensions and characteristics − Part 1: Cast sheets
塑膠-聚甲基丙烯酸甲酯板-類型、尺寸及特性-第2部:押出板
Z7-General & Miscellaneous
CNS 3926    2017 Edition
Dimensions of Printing Types
印刷活字的基本尺度
G-Ferrous Materials & Metallurgy
CNS 9267    2017 Edition
Method of mass calculation for stainless steel plates and sheets,and heat-resisting steel plates and sheets
不銹鋼及耐熱鋼鋼板及鋼片質量計算法
B-Mechanical Engineering
CNS 5274    2017 Edition
Base Tangent Lengths of Spur Gears for Fine Mechanics
精細機械用正齒輪(齒跨距數值表)
C-Electrical Engineering
CNS 12866    2017 Edition
Basic Environmental Testing Procedures Part 2 : Tests-Test Z/AM : Combined Cold/Low Air Pressure Tests
環境試驗法(電氣、電子)–低溫/低氣壓複合試驗法
H-Non-ferrous Materials & Metallurgy
CNS 10442    2017 Edition
Copper and copper alloy rods and bars
銅及銅合金棒
B-Mechanical Engineering
CNS 2724    2017 Edition
Refillable Weld Steel Cylinder for Dissolved Acetylene
溶解乙炔氣熔接鋼瓶

Translated
C-Electrical Engineering
CNS 12865-5    2017 Edition
Method of Test for Digital Microelectronics ( Output Short Circuit Current )
數位微電子檢驗法(輸出端短路電流)
C-Electrical Engineering
CNS 13092    2017 Edition
Measuring Method for LED Outdoor Display Panels
發光二極體顯示幕(戶外用)量測法
S-Domestic Wares
CNS 15420    2017 Edition
Office furniture - Desks and tables
辦公室用桌
B-Mechanical Engineering
CNS 142    2017 Edition
Assembly tools for screws and nuts - Single-head box wrenches,test torque series A
螺釘及螺帽之裝配工具–單頭梅花扳手(A級扭矩)

Translated
A-Civil Engineering & Architecture
CNS 2178    2017 Edition
Liquid Membrane-Forming Compounds for Curing Concrete
混凝土用液膜養護劑

Translated
C-Electrical Engineering
CNS 12256    2017 Edition
Ovens for Quartz Crystal Units
石英振盪晶體用恆溫箱
B-Mechanical Engineering
CNS 1020    2017 Edition
Pickled mustard stems
單十字鎬(僅具單一鴨嘴狀端部)
B-Mechanical Engineering
CNS 249    2017 Edition
Adjustable Machine Reamer, with Square Head
機用活動鉸刀(方頭圓柱柄)
C-Electrical Engineering
CNS 12083    2017 Edition
Method of Test for Fiber Optic Devices (FOPT-33 Fiber Optic Cable Tensile Loading and Bending Test)
光纖裝置檢驗法(光纜拉力負載與彎曲試驗FOTP–33)
K-Chemical Industry
CNS 13024    2017 Edition
Method of Test for Glass-Fiber-Reinforced Plastic Panel Water Tank
玻璃纖維強化塑膠嵌板組合式儲水槽檢驗法

Translated
B-Mechanical Engineering
CNS 523    2017 Edition
Plug Connection Devices for Explosion-Proof Type Battery Locomotives
韋氏螺紋量柱(通過端限界尺寸、精配、中配及粗配)
K-Chemical Industry
CNS 783-3-2    2017 Edition
Sodium carbonate for industrial use - Part 3-2 : Determination of total soluble alkalinity - Potentiometric method
工業用碳酸鈉-第3-2部:總可溶性鹼含量測定法-電位差滴定法
B-Mechanical Engineering
CNS 1132    2017 Edition
Pliers and nippers - Diagonal cutting nippers
夾鉗與剪鉗-對口剪鉗(平口鉗)
Z8-General & Miscellaneous
CNS 13342    2017 Edition
Glossary of Terms Related to Nondestructive Testing (Ultrasonic Testing Terms)
非破壞檢測詞彙(超音波檢測名詞)
C-Electrical Engineering
CNS 6127    2017 Edition
General Rules for Reliability Assured Discrete Semiconductor Devices
可靠度保證單件半導體裝置總則
S-Domestic Wares
CNS 16025    2017 Edition
Child use and care articles-Infant bath tubs
兒童照護用品-嬰兒用浴盆
K-Chemical Industry
CNS 3922    2017 Edition
Method of Test for Lacquer in Surface of Leather's Shoes
皮鞋面革用噴漆檢驗法

Translated
B-Mechanical Engineering
CNS 13268    2017 Edition
Test Methods for Performance and Accuracy of Moulding Machine
多軸鉋機之性能試驗及精度檢驗法
B-Mechanical Engineering
CNS 5268    2017 Edition
Accuracy of Cylindrical Gear Teeth Tolerance for Errors of Composite
圓柱齒輪輪齒之精度(嚙合複合誤差之公差)
C-Electrical Engineering
CNS 13623    2017 Edition
Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method)
單晶片之電阻率、霍爾係數及霍爾移動率之測定法(范德普法)

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