"1,1,2,2 " CNS Standards List |
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CNS 11992
1987 Edition Method of Test for Fiber Optic Devices (FOTP-42 Optical Crosstalk in Fiber Optic Components) 光纖裝置檢驗法（光纖零組件內之串訊FOTP-42） |
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CNS 12007
1987 Edition Method of Test for Helical Scanning Video Tape Recorders 螺線掃描錄放影機檢驗法 |
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CNS 11812
1987 Edition Method of Test for Amplifiers 擴大機檢驗法 |
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CNS 712
1987 Edition Brass Screwed Globe Valves (10 kgf/㎠) 黃銅螺紋口球型閥(10 kgf/cm2) |
Translated |
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CNS 12068
1987 Edition Support of Die Casting Molds 壓鑄模用支座 |
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CNS 12069
1987 Edition Ejector Rod of Die Casting Molds 壓鑄模用頂出桿 |
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CNS 11902
1987 Edition Method of Test for Fiber Optic Devices (FOTP-52 Temperature Dependence of Attenuation for Optical Fibers) 光纖裝置檢驗法（溫度變化對光纖衰減之影響FOTP-52） |
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CNS 11932
1987 Edition Angle Pins of Molds for Plastics 塑膠型模用角銷 |
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CNS 12070
1987 Edition Ejectorplate Guide Pin of Die Casting Molds 壓鑄模用頂出板導銷 |
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CNS 11877
1987 Edition Phonograph Pick-Ups with 12.7mm Mounting 12.7 mm安裝孔距之電唱機拾音器 |
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CNS 11829
1987 Edition Light Emitting Diodes (for Indication) 發光二極體(指示用) |
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CNS 12071
1987 Edition Angle Pin of Die Casting Molds 壓鑄模用斜角撐銷 |
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CNS 11828
1987 Edition Method of Test for Blast Furnace Slag for Road Construction 道路用高爐爐碴檢驗法 |
Translated |
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CNS 12073
1987 Edition Die Materials of Hot Forging Closed Die 熱鍛閉合模之模具材料 |
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CNS 12076
1987 Edition Die Wear Tolerance for Hot Forging Closed Die 熱鍛閉合模之模具磨耗許可量 |
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CNS 7661
1987 Edition Method of Test for Low Frequency (Below 3 MHz) Electrical Connector (TP - 22 Life Test) 頻率3 MHz以下電連接器檢驗法（壽命試驗TP-22） |
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CNS 12075
1987 Edition Wall Thickness and Height for Different Cross Sections of Hot Forging Closed Die 熱鍛閉合模之不同形狀斷面最小厚度及最小高度 |
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CNS 12074
1987 Edition Flash Cavity of Hot Forging Closed Die 熱鍛閉合模之餘料穴 |
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CNS 12072
1987 Edition Locating Pin of Die Casting Molds 壓鑄模用定位銷 |
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CNS 2701
1986 Edition Aluminium Casserole 鋁蒸籠 |
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CNS 8216
1986 Edition Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 26 Salt Spray Corrosion Test) 頻率3 MHz以下電連接器檢驗法（鹽水噴霧腐蝕試驗TP-26） |
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CNS 6127
1986 Edition General Rules for Reliability Assured Discrete Semiconductor Devices 可靠度保證單件半導體裝置總則 |
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CNS 8219
1986 Edition Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 29 Contact Retention Test ) 頻率3 MHz以下電連接器檢驗法(接點之牢固試驗TP-29) |
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CNS 11624
1986 Edition Crystal Unit、Quartz、CR-84/u、for Radio Oscillation 無線電機振盪用CR-84/u石英晶體 |
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CNS 8220
1986 Edition Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 31 Humidity Test ) 頻率3 MHz以下電連接器檢驗法（耐濕性試驗TP-31） |
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CNS 11520
1986 Edition Method of Pitting Potential Measurement for Stainless Steels 不銹鋼之孔蝕電位測定法 |
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CNS 11625
1986 Edition Paper Dielectric Capacitors for AC and DC By-Pass Radio-Interference Reduction 交直流分路射頻干擾衰減用紙介質電容器 |
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CNS 11705
1986 Edition Method of Test for Fiber Devices (FOTP-20 Change of Optical Transmittance) 光纖組件檢驗法（透射率改變FOTP-20） |
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CNS 11762
1986 Edition Environmental Requirements for Electronic Equipments 電子設備之使用環境條件 |
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CNS 10224
1986 Edition Test Code for Accuracy of Knife Grinders 鉋刀研磨機精度檢驗標準 |
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