"1,2 " CNS Standards List |
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CNS 12071
1987 Edition Angle Pin of Die Casting Molds 壓鑄模用斜角撐銷 |
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CNS 12072
1987 Edition Locating Pin of Die Casting Molds 壓鑄模用定位銷 |
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CNS 12073
1987 Edition Die Materials of Hot Forging Closed Die 熱鍛閉合模之模具材料 |
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CNS 12074
1987 Edition Flash Cavity of Hot Forging Closed Die 熱鍛閉合模之餘料穴 |
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CNS 12077
1987 Edition Minimum Rounded Radii and Drafts of Hot Forging Closed Die 熱鍛閉合模之最小圓角半徑與拔模斜度(角度) |
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CNS 12076
1987 Edition Die Wear Tolerance for Hot Forging Closed Die 熱鍛閉合模之模具磨耗許可量 |
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CNS 12075
1987 Edition Wall Thickness and Height for Different Cross Sections of Hot Forging Closed Die 熱鍛閉合模之不同形狀斷面最小厚度及最小高度 |
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CNS 9231
1987 Edition Method of Test for Dry Reed Switches(Physical Dimensions) 乾式簧開關檢驗法（實體尺度） |
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CNS 11823
1987 Edition Glossary of Terms Related to Nondestructive Testing (Eddly Current Testing Terms) 非破壞檢測詞彙（渦電流檢測名詞） |
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CNS 11932
1987 Edition Angle Pins of Molds for Plastics 塑膠型模用角銷 |
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CNS 11877
1987 Edition Phonograph Pick-Ups with 12.7mm Mounting 12.7 mm安裝孔距之電唱機拾音器 |
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CNS 11829
1987 Edition Light Emitting Diodes (for Indication) 發光二極體(指示用) |
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CNS 11828
1987 Edition Method of Test for Blast Furnace Slag for Road Construction 道路用高爐爐碴檢驗法 |
Translated |
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CNS 12108
1987 Edition Method of Test for Acid-Soluble Lignin in Wood and Pulp 木材及紙漿中酸溶性木質素試驗法 |
Translated |
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CNS 11812
1987 Edition Method of Test for Amplifiers 擴大機檢驗法 |
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CNS 11902
1987 Edition Method of Test for Fiber Optic Devices (FOTP-52 Temperature Dependence of Attenuation for Optical Fibers) 光纖裝置檢驗法（溫度變化對光纖衰減之影響FOTP-52） |
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CNS 12119
1987 Edition Method of Test for Packaging and Appearance of Audio Product 音響產品包裝、外觀檢驗法 |
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CNS 7661
1987 Edition Method of Test for Low Frequency (Below 3 MHz) Electrical Connector (TP - 22 Life Test) 頻率3 MHz以下電連接器檢驗法（壽命試驗TP-22） |
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CNS 11892
1987 Edition Shears for Flower and Grass Cutting 手剪（修剪花草用） |
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CNS 7660
1986 Edition Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 21 Insulation Resistance) 頻率3 MHz以下電連接器檢驗法（絕緣電阻T-21） |
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CNS 6127
1986 Edition General Rules for Reliability Assured Discrete Semiconductor Devices 可靠度保證單件半導體裝置總則 |
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CNS 8218
1986 Edition Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 28 Vibration Test ) 頻率3 MHz以下電連接器檢驗法（振動試驗TP-28） |
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CNS 11521
1986 Edition Method for Making Anode Polarization Measurement for Stainless Steels 不銹鋼之陽極極化曲線測定法 |
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CNS 8217
1986 Edition Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 27 Mechanical Shock Specified Pulse) 頻率3 MHz以下電連接器檢驗法（特定脈衝機械衝擊試驗TP-27） |
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CNS 11624
1986 Edition Crystal Unit、Quartz、CR-84/u、for Radio Oscillation 無線電機振盪用CR-84/u石英晶體 |
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CNS 11762
1986 Edition Environmental Requirements for Electronic Equipments 電子設備之使用環境條件 |
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CNS 8216
1986 Edition Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 26 Salt Spray Corrosion Test) 頻率3 MHz以下電連接器檢驗法（鹽水噴霧腐蝕試驗TP-26） |
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CNS 11572
1986 Edition Method of Test for Low Frequency (Below 3MHz) Electrical Connectors (TP-46 Continuity Test) 頻率3 MHz以下電連接器檢驗法（連續性試驗TP-46） |
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CNS 11612
1986 Edition Mechanical Grooved Pipe Coupling 機械開槽式管接頭 |
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CNS 11582
1986 Edition Method of Test for Epoxy Resin Non-Zinc Primer 環氧樹脂非鋅底漆檢驗法 |
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