"3, " CNS Standards List| Method Test | Information technology | Methods Test | Etching primer | Mobile elevating | Polyester Filament | Information technology | Socket Outlet | |
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CNS 13808
1997 Edition Epitaxial Wafers for Light Emitting Diodes 發光二極體磊晶片 |
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CNS 13989
1997 Edition Glossary of terms for production automation and inventory management (General) 生產自動化與庫存管理詞彙（一般名詞） |
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CNS 13904
1997 Edition Expression of the properties of sampling oscilloscopes 取樣示波器特性 |
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CNS 13999
1997 Edition General methods of measuring the performances of ultrasonic pulse-echo diagnostic equipment 脈衝式反射法超音波診斷裝置檢驗法 |
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CNS 13622
1997 Edition Fixed chip resistor for use in electronic equipment 電子設備用固定晶片電阻器 |
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CNS 7357
1997 Edition Polyvinyl formal enamelled round aluminium winding wires 聚乙烯醇縮甲醛漆包鋁線 |
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CNS 13989-1
1997 Edition Glossary of terms for production automation and inventory management (Terms of inventory management) 生產自動化與庫存管理詞彙（有關庫存管理之名詞） |
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CNS 13902
1997 Edition Expression of the properties of cathode-ray oscilloscopes 陰極射線示波器特性 |
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CNS 13804
1997 Edition Guidance on the Use of the Substitution Method for Measurements of Radiation from Microwave Ovens for Frequencies above 1 GHz 應用置換法測量微波爐1GHz以上之輻射指引 |
Translated |
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CNS 13805
1997 Edition Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers 光電半導體晶圓之光激光譜量測法 |
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CNS 13942
1997 Edition Micrographics-Computer output microfiche (COM)-Microfiche A6 微縮技術－電腦輸出微縮單片(COM)-A6型微縮單片 |
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CNS 13806
1997 Edition Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes 發光二極體磊晶片發光波長與亮度量測法 |
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CNS 13991
1997 Edition Fixed resistor networks with individually measurable resistors for use in electronic equipment 電子設備用可單獨量測個別電阻元件之固定網路電阻器 |
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CNS 13722
1996 Edition Documentation-Headers for Microfiche of Monographs and Serials 文獻－圖書與期刊的微縮單片標題 |
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CNS 13754
1996 Edition Corrosion of Metals and Alloys-Corrosivity of Atmospheres-Measurement of Pollution 金屬及合金之腐蝕－大氣腐蝕性(污染之測定) |
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CNS 13801
1996 Edition Photography-Processed Photographic Black-and-White Film for Archival Records-Silver-Gelatin Type on Cellulose Ester Base-Specifications 照相技術－顯像處理完畢之存檔底片－銀鹽膠膜纖維素酯片基底片－基本規格 |
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CNS 13800
1996 Edition Photography-Processed Photographic Black-and-White Film for Archival Records-Silver-Gelatin Type on Poly (Ethylene Terephthalate) Base-Specification 照相技術－顯像處理完畢之存檔底片－銀鹽膠膜聚酯纖維片基底片－基本規格 |
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CNS 13790
1996 Edition Measuring Methods of Fiber Optical Branching Components for Communication 通信用光分歧元件量測法 |
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CNS 13720
1996 Edition Micrographics-ISO Resolution Test Chart No 2-Description and Use 微縮技術－國際標準組織二號解像率測試卡－結構與應用 |
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CNS 13653
1996 Edition Lot-Control Testing for Light Emitting Diode(for Communication) 通信用發光二極體之批品質控制測試 |
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CNS 13781
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias) 自動控制用紅外發光二極體耐久性試驗法－預燒試驗（順向偏壓） |
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CNS 11395
1996 Edition Method of Test for Stiffness of Paper and Paperboard(Taber Stiffness Tester) 紙及紙板剛度試驗法（Taber剛度試驗機） |
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CNS 13780
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test 自動控制用紅外發光二極體耐久性試驗法－連續通電試驗 |
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CNS 13779
1996 Edition Measuring Methods for Infrared Emitting Diodes (IRED)(for Automation) 自動控制用紅外發光二極體量測法 |
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CNS 13727
1996 Edition Method of Test for Volume Resistivity of Conductive Adhesives 導電膠之體積電阻率量測法 |
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CNS 13726
1996 Edition Method of Test for Shear Strength of Dil Bond 晶粒固著強度試驗法 |
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CNS 13725
1996 Edition Method of Nondestructive Test for Microelectronic Wire Bonds 微電子銲線之非破壞性拉力試驗法 |
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CNS 13724
1996 Edition Method of Test for Pull Strength of Microelectronic Wire Bonds 微電子銲線拉力試驗法 |
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CNS 13723
1996 Edition Extensometers Used in Metallic Material Tensile 金屬材料拉伸試驗用伸長計 |
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CNS 13656
1996 Edition Lot-Control Testing for Photodiode(for Communication) 通信用光二極體之批品質控制測試 |
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