"3, " CNS Standards List |
|
CNS 13806
1997 Edition Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes 發光二極體磊晶片發光波長與亮度量測法 |
|
|
|
CNS 13810
1997 Edition Lead Frames for Light Emitting Diodes 發光二極體用支架 |
|
|
|
CNS 3471
1997 Edition PE-insulated pair type aluminium tape shield,PE-sheathed,telephone cable 聚乙烯絕緣鋁帶聚乙烯被覆市內對型電話電纜 |
Translated |
|
|
CNS 11299-3
1997 Edition Glossary of terms for sensing and transducing (Terms of fundamental concept of trransducing for general instrument technology) 感測與轉換詞彙(有關一般儀表技術之轉換基本觀念名詞) |
|
|
|
CNS 13942
1997 Edition Micrographics-Computer output microfiche (COM)-Microfiche A6 微縮技術－電腦輸出微縮單片(COM)-A6型微縮單片 |
|
|
|
CNS 3510
1997 Edition Copper and copper alloy covered electrodes 銅及銅合金被覆銲條 |
|
|
|
CNS 13941
1997 Edition Micrographics-Microfilming of documents on 16mm and 35mm silver-gelatin type microfilm-Operating procedures 微縮技術－16 mm及35 mm銀鹽片之文件縮攝法－作業程序 |
|
|
|
CNS 13809
1997 Edition Light Emitting Diode Dice 發光二極體晶粒 |
|
|
|
CNS 3592
1997 Edition Nickel and nickel alloy covered electrodes 鎳及鎳合金被覆銲條 |
|
|
|
CNS 13808
1997 Edition Epitaxial Wafers for Light Emitting Diodes 發光二極體磊晶片 |
|
|
|
CNS 13807
1997 Edition Methods of Test of Epoxy for Light Emitting Diodes 發光二極體用環氧樹脂試驗法 |
|
|
|
CNS 13804
1997 Edition Guidance on the Use of the Substitution Method for Measurements of Radiation from Microwave Ovens for Frequencies above 1 GHz 應用置換法測量微波爐1GHz以上之輻射指引 |
Translated |
|
|
CNS 13805
1997 Edition Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers 光電半導體晶圓之光激光譜量測法 |
|
|
|
CNS 13648
1996 Edition Measuring Methods for Laser Diode(for Communication) 通信用雷射二極體量測法 |
|
|
|
CNS 13793
1996 Edition Measuring Methods of Optical Isolators for Communication 通信用光隔離器量測法 |
|
|
|
CNS 13723
1996 Edition Extensometers Used in Metallic Material Tensile 金屬材料拉伸試驗用伸長計 |
|
|
|
CNS 13636
1996 Edition Steel Butt-welding Pipe Fittings 配管用鋼製對接銲接式管件 |
|
|
|
CNS 13779
1996 Edition Measuring Methods for Infrared Emitting Diodes (IRED)(for Automation) 自動控制用紅外發光二極體量測法 |
|
|
|
CNS 13780
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test 自動控制用紅外發光二極體耐久性試驗法－連續通電試驗 |
|
|
|
CNS 13794
1996 Edition Measuring Methods of Optical Filter for Communication 通信用光濾波器量測法 |
|
|
|
CNS 13652
1996 Edition Reliability Testing for Light Emitting Diode(for Communication) 通信用發光二極體之可靠度測試 |
|
|
|
CNS 13720
1996 Edition Micrographics-ISO Resolution Test Chart No 2-Description and Use 微縮技術－國際標準組織二號解像率測試卡－結構與應用 |
|
|
|
CNS 13722
1996 Edition Documentation-Headers for Microfiche of Monographs and Serials 文獻－圖書與期刊的微縮單片標題 |
|
|
|
CNS 13754
1996 Edition Corrosion of Metals and Alloys-Corrosivity of Atmospheres-Measurement of Pollution 金屬及合金之腐蝕－大氣腐蝕性(污染之測定) |
|
|
|
CNS 13651
1996 Edition Measuring Methods for Light Emitting Diode(for Communication) 通信用發光二極體量測法 |
|
|
|
CNS 13650
1996 Edition Lot-Control Testing for Laser Diode(for Communication) 通信用雷射二極體之批品質控制測試 |
|
|
|
CNS 13782
1996 Edition Realiability Assured Infrared Emitting Diodes (IRED)(for Automation) 自動控制用可靠度保證紅外發光二極體 |
|
|
|
CNS 13791
1996 Edition Measuring Methods of Optical Attenuator for Communication 通信用光衰減器量測法 |
|
|
|
CNS 13781
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias) 自動控制用紅外發光二極體耐久性試驗法－預燒試驗（順向偏壓） |
|
|
|
CNS 13792
1996 Edition Measuring Methods of Optical Polarizer for Communication 通信用光極化器量測法 |
|
| Find out:6360Items | To Page of: First -Previous-Next -Last | [180] [181] [182] [183] [184] [185] [186] |
