"3 " CNS Standards List| Switches appliances | Symbols Distribution | Classification labelling | Identification cards | Cross Recessed | Textiles − | Testing method | Acrylonitrile | |
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CNS 13804
1997 Edition Guidance on the Use of the Substitution Method for Measurements of Radiation from Microwave Ovens for Frequencies above 1 GHz 應用置換法測量微波爐1GHz以上之輻射指引 |
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CNS 13805
1997 Edition Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers 光電半導體晶圓之光激光譜量測法 |
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CNS 13806
1997 Edition Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes 發光二極體磊晶片發光波長與亮度量測法 |
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CNS 13807
1997 Edition Methods of Test of Epoxy for Light Emitting Diodes 發光二極體用環氧樹脂試驗法 |
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CNS 13622
1997 Edition Fixed chip resistor for use in electronic equipment 電子設備用固定晶片電阻器 |
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CNS 13809
1997 Edition Light Emitting Diode Dice 發光二極體晶粒 |
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CNS 13811
1997 Edition Numerical-Type Reflectors for Light Emitting Diodes 發光二極體數字型反射套板 |
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CNS 13902
1997 Edition Expression of the properties of cathode-ray oscilloscopes 陰極射線示波器特性 |
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CNS 13903
1997 Edition Expression of the properties of storage cathode-ray oscilloscopes 儲存式陰極射線示波器特性 |
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CNS 13904
1997 Edition Expression of the properties of sampling oscilloscopes 取樣示波器特性 |
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CNS 13989
1997 Edition Glossary of terms for production automation and inventory management (General) 生產自動化與庫存管理詞彙（一般名詞） |
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CNS 3471
1997 Edition PE-insulated pair type aluminium tape shield,PE-sheathed,telephone cable 聚乙烯絕緣鋁帶聚乙烯被覆市內對型電話電纜 |
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CNS 13808
1997 Edition Epitaxial Wafers for Light Emitting Diodes 發光二極體磊晶片 |
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CNS 13725
1996 Edition Method of Nondestructive Test for Microelectronic Wire Bonds 微電子銲線之非破壞性拉力試驗法 |
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CNS 13722
1996 Edition Documentation-Headers for Microfiche of Monographs and Serials 文獻－圖書與期刊的微縮單片標題 |
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CNS 13792
1996 Edition Measuring Methods of Optical Polarizer for Communication 通信用光極化器量測法 |
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CNS 8837
1996 Edition Methods of Test for Optical Rotation of Chemical Products 化學製品旋光度測定法 |
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CNS 8838
1996 Edition Methods of Test for Loss and Residue of Chemical Products 化學製品減量及殘留分測定法 |
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CNS 8839
1996 Edition Methods of Test for Refractive Index of Chemical Products 化學製品折射率測定法 |
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CNS 13794
1996 Edition Measuring Methods of Optical Filter for Communication 通信用光濾波器量測法 |
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CNS 13628
1996 Edition Lifts for Construction Use 營建用提升機 |
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CNS 13754
1996 Edition Corrosion of Metals and Alloys-Corrosivity of Atmospheres-Measurement of Pollution 金屬及合金之腐蝕－大氣腐蝕性(污染之測定) |
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CNS 13790
1996 Edition Measuring Methods of Fiber Optical Branching Components for Communication 通信用光分歧元件量測法 |
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CNS 13724
1996 Edition Method of Test for Pull Strength of Microelectronic Wire Bonds 微電子銲線拉力試驗法 |
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CNS 12937
1996 Edition Structure of Welded SteelTanks for Petroleum Oil Storage 鋼製全熔接石油類儲槽構造 |
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CNS 13782
1996 Edition Realiability Assured Infrared Emitting Diodes (IRED)(for Automation) 自動控制用可靠度保證紅外發光二極體 |
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CNS 13726
1996 Edition Method of Test for Shear Strength of Dil Bond 晶粒固著強度試驗法 |
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CNS 13781
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias) 自動控制用紅外發光二極體耐久性試驗法－預燒試驗（順向偏壓） |
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CNS 13780
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test 自動控制用紅外發光二極體耐久性試驗法－連續通電試驗 |
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CNS 13720
1996 Edition Micrographics-ISO Resolution Test Chart No 2-Description and Use 微縮技術－國際標準組織二號解像率測試卡－結構與應用 |
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