"3 " CNS Standards List |
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CNS 3510
1997 Edition Copper and copper alloy covered electrodes 銅及銅合金被覆銲條 |
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CNS 13810
1997 Edition Lead Frames for Light Emitting Diodes 發光二極體用支架 |
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CNS 13942
1997 Edition Micrographics-Computer output microfiche (COM)-Microfiche A6 微縮技術－電腦輸出微縮單片(COM)-A6型微縮單片 |
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CNS 3471
1997 Edition PE-insulated pair type aluminium tape shield,PE-sheathed,telephone cable 聚乙烯絕緣鋁帶聚乙烯被覆市內對型電話電纜 |
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CNS 13808
1997 Edition Epitaxial Wafers for Light Emitting Diodes 發光二極體磊晶片 |
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CNS 13809
1997 Edition Light Emitting Diode Dice 發光二極體晶粒 |
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CNS 13941
1997 Edition Micrographics-Microfilming of documents on 16mm and 35mm silver-gelatin type microfilm-Operating procedures 微縮技術－16 mm及35 mm銀鹽片之文件縮攝法－作業程序 |
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CNS 13805
1997 Edition Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers 光電半導體晶圓之光激光譜量測法 |
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CNS 3510-1
1997 Edition Copper and copper alloy gas welding rods 銅及銅合金氣銲條 |
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CNS 13804
1997 Edition Guidance on the Use of the Substitution Method for Measurements of Radiation from Microwave Ovens for Frequencies above 1 GHz 應用置換法測量微波爐1GHz以上之輻射指引 |
Translated |
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CNS 7357
1997 Edition Polyvinyl formal enamelled round aluminium winding wires 聚乙烯醇縮甲醛漆包鋁線 |
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CNS 3592
1997 Edition Nickel and nickel alloy covered electrodes 鎳及鎳合金被覆銲條 |
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CNS 13806
1997 Edition Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes 發光二極體磊晶片發光波長與亮度量測法 |
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CNS 13724
1996 Edition Method of Test for Pull Strength of Microelectronic Wire Bonds 微電子銲線拉力試驗法 |
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CNS 13655
1996 Edition Reliability Testing for Photodiode(for Communication) 通信用光二極體之可靠度測試 |
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CNS 11395
1996 Edition Method of Test for Stiffness of Paper and Paperboard(Taber Stiffness Tester) 紙及紙板剛度試驗法（Taber剛度試驗機） |
Translated |
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CNS 13722
1996 Edition Documentation-Headers for Microfiche of Monographs and Serials 文獻－圖書與期刊的微縮單片標題 |
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CNS 13723
1996 Edition Extensometers Used in Metallic Material Tensile 金屬材料拉伸試驗用伸長計 |
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CNS 8837
1996 Edition Methods of Test for Optical Rotation of Chemical Products 化學製品旋光度測定法 |
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CNS 13651
1996 Edition Measuring Methods for Light Emitting Diode(for Communication) 通信用發光二極體量測法 |
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CNS 13720
1996 Edition Micrographics-ISO Resolution Test Chart No 2-Description and Use 微縮技術－國際標準組織二號解像率測試卡－結構與應用 |
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CNS 13652
1996 Edition Reliability Testing for Light Emitting Diode(for Communication) 通信用發光二極體之可靠度測試 |
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CNS 8834
1996 Edition Methods of Test for Density and Relative Density (Specific Gravity) of Chemical Products 化學製品密度及比重測定法 |
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CNS 13725
1996 Edition Method of Nondestructive Test for Microelectronic Wire Bonds 微電子銲線之非破壞性拉力試驗法 |
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CNS 13635
1996 Edition Steel Butt-welding Pipe Fittings for Ordinary Use 一般配管用鋼製對接銲接式管件 |
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CNS 13727
1996 Edition Method of Test for Volume Resistivity of Conductive Adhesives 導電膠之體積電阻率量測法 |
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CNS 13782
1996 Edition Realiability Assured Infrared Emitting Diodes (IRED)(for Automation) 自動控制用可靠度保證紅外發光二極體 |
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CNS 13653
1996 Edition Lot-Control Testing for Light Emitting Diode(for Communication) 通信用發光二極體之批品質控制測試 |
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CNS 13636
1996 Edition Steel Butt-welding Pipe Fittings 配管用鋼製對接銲接式管件 |
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CNS 8839
1996 Edition Methods of Test for Refractive Index of Chemical Products 化學製品折射率測定法 |
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