"Circuit " CNS Standards List |
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CNS 15811-3
2015 Edition Integrated Circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 3: Bulk current injection (BCI) method 積體電路－150 kHz 至1 GHz 電磁抗擾度量測－第3 部：大電流注入法 |
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CNS 15811-2
2015 Edition Integrated Circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 2: Measurement of radiated immunity − TEM cell and wideband TEM cell method 積體電路－150 kHz 至1 GHz 電磁抗擾度量測－第2 部：輻射抗擾度量測－橫向電磁波室與寬頻橫向電磁波室法 |
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CNS 15811-1
2015 Edition Intergrated Circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 1: General conditions and definitions 積體電路－150 kHz至1 GHz電磁抗擾度量測－第1部：一般條件及定義 |
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CNS 15748-6
2015 Edition Integrated Circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method 積體電路－150 kHz至1 GHz電磁放射量測－第6部：傳導放射量測－磁場探棒法 |
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CNS 15811-4
2015 Edition Integrated Circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method 積體電路－150 kHz至1 GHz電磁抗擾度量測－第4部：射頻功率直接注入法 |
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CNS 15811-3
2015 Edition Integrated Circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 3: Bulk current injection (BCI) method 積體電路－150 kHz至1 GHz電磁抗擾度量測－第3部：大電流注入法 |
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CNS 15811-2
2015 Edition Integrated Circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 2: Measurement of radiated immunity − TEM cell and wideband TEM cell method 積體電路－150 kHz至1 GHz電磁抗擾度量測－第2部：輻射抗擾度量測－橫向電磁波室與寬頻橫向電磁波室法 |
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CNS 15811-5
2015 Edition Integrated Circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 5: Workbench Faraday cage method 積體電路－150 kHz至1 GHz電磁抗擾度量測－第5部：工作台法拉第箱體法 |
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CNS 14734
2003 Edition Terms and definitions for printed Circuits 印刷電路術語和定義 |
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CNS 6135-2
2000 Edition Hearing aids-Part2: Hearing aids with automatic gain control Circuits 助聽器－第2部：用自動增益控制電路的助聽器 |
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CNS 6135-6
2000 Edition Hearing aids-Part6: Characteristics of electrical input Circuit for hearing aids 助聽器－第6部：電氣輸入電路的特性 |
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CNS 12865-5
1991 Edition Method of Test for Digital Microelectronics ( Output Short Circuit Current ) 數位微電子檢驗法（輸出端短路電流） |
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CNS 318
1971 Edition AC Circuit Breakers (for Short Circuit Test) 交流斷路器標準（短路試驗用） |
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