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中華民國國家標準
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"fo " CNS Standards List

C-Electrical Engineering
CNS 14140    1998 Edition
Reliability and lot control tests for transmitter and receiver modules used for wireless infrared communication
無線通信用紅外線傳輸和接收模組之可靠度及批品質控制測試
C-Electrical Engineering
CNS 14139    1998 Edition
Measurement methods for the performance of transmitter and receiver modules used for wireless infrared communication
無線通信用紅外線傳輸和接收模組功能特性量測法
C-Electrical Engineering
CNS 14113    1998 Edition
Reliability tests for passive devices (for fiber optical communication)
光纖通信用被動元件之可靠度測試
C-Electrical Engineering
CNS 14111    1998 Edition
Methods of measurement for optical polarization controller
光極化控制器量測法
Z-#N/A
CNS 12845    1998 Edition
Method of straight-beam ultrasonic test for structure-use steel plate
結構用鋼板超音波直束檢測法
B-Mechanical Engineering
CNS 10956    1998 Edition
Test code for accuracy of circular sawing machines
圓鋸機精度檢驗
B-Mechanical Engineering
CNS 142    1998 Edition
Assembly tools for screws and nuts - Single-head box wrenches,test torque series A
螺釘及螺帽之裝配工具-單頭梅花扳手(A級扭矩)

Translated
C-Electrical Engineering
CNS 12153    1998 Edition
Fittings for pliable plastic conduits
合成樹脂可撓電線導管用配件
C-Electrical Engineering
CNS 14179    1998 Edition
Reliability tests for digital transmitter and receiver modules used for optical fiber communication
光纖通信用數位傳輸和接收模組之可靠度測試
Z-#N/A
CNS 14136    1998 Edition
Method of ultrasonic test for steel forgings
鍛鋼品超音波檢測法
B-Mechanical Engineering
CNS 10957    1998 Edition
Test code for performance of circular sawing machines
圓鋸機動態檢驗法
Z-#N/A
CNS 14135    1998 Edition
Method of thickness measurement by ultrasonic pulse echo technique for metals
金屬材料超音波測厚法
G-Ferrous Materials & Metallurgy
CNS 14291    1998 Edition
Method of tensile creep rupture test for metallic materials
金屬材料拉伸潛變破斷試驗法
C-Electrical Engineering
CNS 14112    1998 Edition
Methods of measurement for optical variable polarization beam splitter
可調型光極化分光器量測法
C-Electrical Engineering
CNS 13811    1997 Edition
Numerical-Type Reflectors for Light Emitting Diodes
發光二極體數字型反射套板
C-Electrical Engineering
CNS 13992    1997 Edition
Fixed resistor networks in which not all resistors are individually measurable for use in electronic equipment
電子設備用不可單獨量測所有電阻元件之固定網路電阻器
C-Electrical Engineering
CNS 13991    1997 Edition
Fixed resistor networks with individually measurable resistors for use in electronic equipment
電子設備用可單獨量測個別電阻元件之固定網路電阻器
B-Mechanical Engineering
CNS 13989-6    1997 Edition
Glossary of terms for production automation and inventory management (Terms of purchase)
生產自動化與庫存管理詞彙(有關採購之名詞)
B-Mechanical Engineering
CNS 13989-4    1997 Edition
Glossary of terms for production automation and inventory management (Terms of capacity planning)
生產自動化與庫存管理詞彙(有關產能規劃之名詞)
B-Mechanical Engineering
CNS 13989-2    1997 Edition
Glossary of terms for production automation and inventory management (Terms of material requirements planning)
生產自動化與庫存管理詞彙(有關物料需求規劃之名詞)
B-Mechanical Engineering
CNS 13989-1    1997 Edition
Glossary of terms for production automation and inventory management (Terms of inventory management)
生產自動化與庫存管理詞彙(有關庫存管理之名詞)
C-Electrical Engineering
CNS 11785    1997 Edition
Method of test for monitor
監視器檢驗法
T-Medical Equipments & Appliances
CNS 13999    1997 Edition
General methods of measuring the performances of ultrasonic pulse-echo diagnostic equipment
脈衝式反射法超音波診斷裝置檢驗法
C-Electrical Engineering
CNS 4899    1997 Edition
Test methods of fixed resistors for use in electronic equipment
電子設備用固定電阻器檢驗法
B-Mechanical Engineering
CNS 13989-5    1997 Edition
Glossary of terms for production automation and inventory management (Terms of forecast)
生產自動化與庫存管理詞彙(有關預測之名詞)
C-Electrical Engineering
CNS 13810    1997 Edition
Lead Frames for Light Emitting Diodes
發光二極體用支架
C-Electrical Engineering
CNS 13808    1997 Edition
Epitaxial Wafers for Light Emitting Diodes
發光二極體磊晶片
C-Electrical Engineering
CNS 13807    1997 Edition
Methods of Test of Epoxy for Light Emitting Diodes
發光二極體用環氧樹脂試驗法
C-Electrical Engineering
CNS 13806    1997 Edition
Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes
發光二極體磊晶片發光波長與亮度量測法
C-Electrical Engineering
CNS 13805    1997 Edition
Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers
光電半導體晶圓之光激光譜量測法

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