"f " CNS Standards List |
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CNS 11785
1997 Edition Method of test for monitor 監視器檢驗法 |
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CNS 11299-5
1997 Edition Glossary of terms for sensing and transducing (Terms of measurement signal processing for general instrument technology) 感測與轉æ›è©žå½™(有關一般儀表技術之é‡æ¸¬ä¿¡è™Ÿè™•ç†åè©ž) |
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CNS 11299-3
1997 Edition Glossary of terms for sensing and transducing (Terms of fundamental concept of trransducing for general instrument technology) 感測與轉æ›è©žå½™(有關一般儀表技術之轉æ›åŸºæœ¬è§€å¿µåè©ž) |
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CNS 11299-6
1997 Edition Glossary of terms for sensing and transducing (Terms of display and record for general instrument technology) 感測與轉æ›è©žå½™(有關一般儀表技術之顯示與紀錄åè©ž) |
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CNS 4899
1997 Edition Test methods of fixed resistors for use in electronic equipment é›»åè¨å‚™ç”¨å›ºå®šé›»é˜»å™¨æª¢é©—法 |
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CNS 11299-7
1997 Edition Glossary of terms for sensing and transducing (Terms of measurement methods and equipment) 感測與轉æ›è©žå½™(有關é‡æ¸¬æ–¹æ³•èˆ‡è£å‚™åè©ž) |
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CNS 11299-2
1997 Edition Glossary of terms for sensing and transducing (Terms of fundamental concept of senaing for general instrument technology) 感測與轉æ›è©žå½™(有關一般儀表技術之感測基本觀念åè©ž) |
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CNS 10760
1997 Edition Method of test for flammability of treated paper and paperboard åŠ å·¥è™•ç†ç´™åŠç´™æ¿é˜²ç„°æ€§è©¦é©— |
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CNS 13903
1997 Edition Expression of the properties of storage cathode-ray oscilloscopes 儲å˜å¼é™°æ¥µå°„線示波器特性 |
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CNS 13992
1997 Edition fixed resistor networks in which not all resistors are individually measurable for use in electronic equipment é›»åè¨å‚™ç”¨ä¸å¯å–®ç¨é‡æ¸¬æ‰€æœ‰é›»é˜»å…ƒä»¶ä¹‹å›ºå®šç¶²è·¯é›»é˜»å™¨ |
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CNS 13991
1997 Edition fixed resistor networks with individually measurable resistors for use in electronic equipment é›»åè¨å‚™ç”¨å¯å–®ç¨é‡æ¸¬å€‹åˆ¥é›»é˜»å…ƒä»¶ä¹‹å›ºå®šç¶²è·¯é›»é˜»å™¨ |
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CNS 13989-6
1997 Edition Glossary of terms for production automation and inventory management (Terms of purchase) 生產自動化與庫å˜ç®¡ç†è©žå½™ï¼ˆæœ‰é—œæŽ¡è³¼ä¹‹å詞） |
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CNS 13989-5
1997 Edition Glossary of terms for production automation and inventory management (Terms of forecast) 生產自動化與庫å˜ç®¡ç†è©žå½™ï¼ˆæœ‰é—œé 測之å詞） |
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CNS 13989-4
1997 Edition Glossary of terms for production automation and inventory management (Terms of capacity planning) 生產自動化與庫å˜ç®¡ç†è©žå½™ï¼ˆæœ‰é—œç”¢èƒ½è¦åŠƒä¹‹å詞） |
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CNS 12808
1997 Edition Quality Requirement for Microfilming from Rotary Cameras 微縮å“製作ï¼è¼ªè½‰å¼ç¸®æ”æ©Ÿæ‹æ”微縮軟片å“質之è¦æ±‚ |
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CNS 7357
1997 Edition Polyvinyl formal enamelled round aluminium winding wires èšä¹™çƒ¯é†‡ç¸®ç”²é†›æ¼†åŒ…é‹ç·š |
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CNS 13942
1997 Edition Micrographics-Computer output microfiche (COM)-Microfiche A6 微縮技術ï¼é›»è…¦è¼¸å‡ºå¾®ç¸®å–®ç‰‡(COM)-A6型微縮單片 |
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CNS 13941
1997 Edition Micrographics-Microfilming of documents on 16mm and 35mm silver-gelatin type microfilm-Operating procedures 微縮技術ï¼16 mmåŠ35 mm銀鹽片之文件縮æ”法ï¼ä½œæ¥ç¨‹åº |
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CNS 13989-2
1997 Edition Glossary of terms for production automation and inventory management (Terms of material requirements planning) 生產自動化與庫å˜ç®¡ç†è©žå½™ï¼ˆæœ‰é—œç‰©æ–™éœ€æ±‚è¦åŠƒä¹‹å詞） |
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CNS 13904
1997 Edition Expression of the properties of sampling oscilloscopes å–樣示波器特性 |
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CNS 13804
1997 Edition Guidance on the Use of the Substitution Method for Measurements of Radiation from Microwave Ovens for Frequencies above 1 GHz 應用置æ›æ³•æ¸¬é‡å¾®æ³¢çˆ1GHz以上之輻射指引 |
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CNS 13999
1997 Edition General methods of measuring the performances of ultrasonic pulse-echo diagnostic equipment 脈è¡å¼å射法超音波診斷è£ç½®æª¢é©—法 |
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CNS 13805
1997 Edition Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers 光電åŠå°Žé«”晶圓之光激光èœé‡æ¸¬æ³• |
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CNS 13989-3
1997 Edition Glossary of terms for production automation and inventory management (Terms of production management) 生產自動化與庫å˜ç®¡ç†è©žå½™ï¼ˆæœ‰é—œç”Ÿç”¢ç®¡ç†ä¹‹å詞） |
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CNS 13902
1997 Edition Expression of the properties of cathode-ray oscilloscopes 陰極射線示波器特性 |
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CNS 13811
1997 Edition Numerical-Type Reflectors for Light Emitting Diodes 發光二極體數å—åž‹åå°„å¥—æ¿ |
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CNS 13810
1997 Edition Lead frames for Light Emitting Diodes 發光二極體用支架 |
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CNS 13808
1997 Edition Epitaxial Wafers for Light Emitting Diodes 發光二極體磊晶片 |
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CNS 13807
1997 Edition Methods of Test of Epoxy for Light Emitting Diodes 發光二極體用環氧樹脂試驗法 |
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CNS 13806
1997 Edition Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes 發光二極體磊晶片發光波長與亮度é‡æ¸¬æ³• |
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