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Chinese National Standards
中華民國國家標準
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"13 " CNS Standards List

Z-#N/A
CNS 14137    1998 Edition
Method of eddy current test for titanium pipes and tubes
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Z-#N/A
CNS 14136    1998 Edition
Method of ultrasonic test for steel forgings
é›é‹¼å“超音波檢測法
Z-#N/A
CNS 14138    1998 Edition
Method of ultrasonic test for titanium pipes and tubes
鈦管超音波檢測法
C-Electrical Engineering
CNS 13903    1997 Edition
Expression of the properties of storage cathode-ray oscilloscopes
儲存å¼é™°æ¥µå°„線示波器特性
C-Electrical Engineering
CNS 13904    1997 Edition
Expression of the properties of sampling oscilloscopes
å–æ¨£ç¤ºæ³¢å™¨ç‰¹æ€§
T-Medical Equipments & Appliances
CNS 13999    1997 Edition
General methods of measuring the performances of ultrasonic pulse-echo diagnostic equipment
脈è¡å¼å射法超音波診斷è£ç½®æª¢é©—法
B-Mechanical Engineering
CNS 13989    1997 Edition
Glossary of terms for production automation and inventory management (General)
生產自動化與庫存管ç†è©žå½™ï¼ˆä¸€èˆ¬å詞)
B-Mechanical Engineering
CNS 13989-1    1997 Edition
Glossary of terms for production automation and inventory management (Terms of inventory management)
生產自動化與庫存管ç†è©žå½™ï¼ˆæœ‰é—œåº«å­˜ç®¡ç†ä¹‹å詞)
C-Electrical Engineering
CNS 13992    1997 Edition
Fixed resistor networks in which not all resistors are individually measurable for use in electronic equipment
é›»å­è¨­å‚™ç”¨ä¸å¯å–®ç¨é‡æ¸¬æ‰€æœ‰é›»é˜»å…ƒä»¶ä¹‹å›ºå®šç¶²è·¯é›»é˜»å™¨
Z-#N/A
CNS 13941    1997 Edition
Micrographics-Microfilming of documents on 16mm and 35mm silver-gelatin type microfilm-Operating procedures
微縮技術ï¼16 mmåŠ35 mméŠ€é¹½ç‰‡ä¹‹æ–‡ä»¶ç¸®æ”æ³•ï¼ä½œæ¥­ç¨‹åº
B-Mechanical Engineering
CNS 13989-6    1997 Edition
Glossary of terms for production automation and inventory management (Terms of purchase)
生產自動化與庫存管ç†è©žå½™ï¼ˆæœ‰é—œæŽ¡è³¼ä¹‹å詞)
B-Mechanical Engineering
CNS 13989-3    1997 Edition
Glossary of terms for production automation and inventory management (Terms of production management)
生產自動化與庫存管ç†è©žå½™ï¼ˆæœ‰é—œç”Ÿç”¢ç®¡ç†ä¹‹å詞)
B-Mechanical Engineering
CNS 13989-4    1997 Edition
Glossary of terms for production automation and inventory management (Terms of capacity planning)
生產自動化與庫存管ç†è©žå½™ï¼ˆæœ‰é—œç”¢èƒ½è¦åŠƒä¹‹å詞)
B-Mechanical Engineering
CNS 13989-2    1997 Edition
Glossary of terms for production automation and inventory management (Terms of material requirements planning)
生產自動化與庫存管ç†è©žå½™ï¼ˆæœ‰é—œç‰©æ–™éœ€æ±‚è¦åŠƒä¹‹å詞)
Z-#N/A
CNS 13942    1997 Edition
Micrographics-Computer output microfiche (COM)-Microfiche A6
微縮技術ï¼é›»è…¦è¼¸å‡ºå¾®ç¸®å–®ç‰‡(COM)-A6型微縮單片
B-Mechanical Engineering
CNS 13989-5    1997 Edition
Glossary of terms for production automation and inventory management (Terms of forecast)
生產自動化與庫存管ç†è©žå½™ï¼ˆæœ‰é—œé æ¸¬ä¹‹å詞)
C-Electrical Engineering
CNS 13991    1997 Edition
Fixed resistor networks with individually measurable resistors for use in electronic equipment
é›»å­è¨­å‚™ç”¨å¯å–®ç¨é‡æ¸¬å€‹åˆ¥é›»é˜»å…ƒä»¶ä¹‹å›ºå®šç¶²è·¯é›»é˜»å™¨
C-Electrical Engineering
CNS 13807    1997 Edition
Methods of Test of Epoxy for Light Emitting Diodes
發光二極體用環氧樹脂試驗法
C-Electrical Engineering
CNS 13804    1997 Edition
Guidance on the Use of the Substitution Method for Measurements of Radiation from Microwave Ovens for Frequencies above 1 GHz
æ‡‰ç”¨ç½®æ›æ³•測é‡å¾®æ³¢çˆ1GHz以上之輻射指引

Translated
C-Electrical Engineering
CNS 13902    1997 Edition
Expression of the properties of cathode-ray oscilloscopes
陰極射線示波器特性
C-Electrical Engineering
CNS 13811    1997 Edition
Numerical-Type Reflectors for Light Emitting Diodes
發光二極體數字型å射套æ¿
C-Electrical Engineering
CNS 13810    1997 Edition
Lead Frames for Light Emitting Diodes
發光二極體用支架
C-Electrical Engineering
CNS 13809    1997 Edition
Light Emitting Diode Dice
發光二極體晶粒
C-Electrical Engineering
CNS 13808    1997 Edition
Epitaxial Wafers for Light Emitting Diodes
發光二極體磊晶片
C-Electrical Engineering
CNS 13622    1997 Edition
Fixed chip resistor for use in electronic equipment
é›»å­è¨­å‚™ç”¨å›ºå®šæ™¶ç‰‡é›»é˜»å™¨
C-Electrical Engineering
CNS 13805    1997 Edition
Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers
光電åŠå°Žé«”æ™¶åœ“ä¹‹å…‰æ¿€å…‰è­œé‡æ¸¬æ³•
C-Electrical Engineering
CNS 13806    1997 Edition
Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes
ç™¼å…‰äºŒæ¥µé«”ç£Šæ™¶ç‰‡ç™¼å…‰æ³¢é•·èˆ‡äº®åº¦é‡æ¸¬æ³•
C-Electrical Engineering
CNS 13724    1996 Edition
Method of Test for Pull Strength of Microelectronic Wire Bonds
微電å­éŠ²ç·šæ‹‰åŠ›è©¦é©—æ³•
Z-#N/A
CNS 13720    1996 Edition
Micrographics-ISO Resolution Test Chart No 2-Description and Use
微縮技術ï¼åœ‹é𛿍™æº–組織二號解åƒçŽ‡æ¸¬è©¦å¡ï¼çµæ§‹èˆ‡æ‡‰ç”¨
C-Electrical Engineering
CNS 13649    1996 Edition
Reliability Testing for Laser Diode(for Communication)
通信用雷射二極體之å¯é åº¦æ¸¬è©¦

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