"Microelectronic" CNS Standards List |
|
CNS 12865-11
2019 Edition Noise margin measurements for digital Microelectronic devices 數位微電子量測法（雜訊邊限量測） |
|
|
|
CNS 12865-4
2017 Edition Method of Test for Digital Microelectronics ( High Level Input Current ) 數位微電子檢驗法（高位準輸入電流） |
|
|
|
CNS 12865-7
2017 Edition Method of Test for Digital Microelectronics ( Drive Source, Dynamic ) 數位微電子檢驗法（驅動源，動態） |
|
|
|
CNS 12865-3
2017 Edition Method of Test for Digital Microelectronics ( Low Level Input Current ) 數位微電子檢驗法（低位準輸入電流） |
|
|
|
CNS 12865-10
2017 Edition Method of Test for Digital Microelectronics (Functional Testing) 數位微電子檢驗法（功能測試） |
|
|
|
CNS 12865-5
2017 Edition Method of Test for Digital Microelectronics ( Output Short Circuit Current ) 數位微電子檢驗法（輸出端短路電流） |
|
|
|
CNS 12865-8
2017 Edition Method of Test for Digital Microelectronics ( Load Condition ) 數位微電子檢驗法（負載條件） |
|
|
|
CNS 12865-1
2017 Edition Method of Test for Digital Microelectronics ( High Level Output Voltage ) 數位微電子檢驗法（高位準輸出電壓） |
|
|
|
CNS 12865-6
2017 Edition Method of Test for Digital Microelectronics ( Terminal Capacitance ) 數位微電子檢驗法（端子電容值） |
|
|
|
CNS 12865-2
2017 Edition Method of Test for Digital Microelectronics ( Low Level Output Voltage ) 數位微電子檢驗法（低位準輸出電壓） |
|
|
|
CNS 12865-9
2017 Edition Method of Test for Digital Microelectronics ( Delay Measurements ) 數位微電子檢驗法（延遲量測） |
|
|
|
CNS 13725
2017 Edition Method of Nondestructive Test for Microelectronic Wire Bonds 微電子銲線之非破壞性拉力試驗法 |
|
|
|
CNS 13724
2017 Edition Method of Test for Pull Strength of Microelectronic Wire Bonds 微電子銲線拉力試驗法 |
|
|
|
CNS 13725
1996 Edition Method of Nondestructive Test for Microelectronic Wire Bonds 微電子銲線之非破壞性拉力試驗法 |
|
|
|
CNS 13724
1996 Edition Method of Test for Pull Strength of Microelectronic Wire Bonds 微電子銲線拉力試驗法 |
|
|
|
CNS 12865-10
1992 Edition Method of Test for Digital Microelectronics (Functional Testing) 數位微電子檢驗法（功能測試） |
|
|
|
CNS 12865-2
1991 Edition Method of Test for Digital Microelectronics ( Low Level Output Voltage ) 數位微電子檢驗法（低位準輸出電壓） |
|
|
|
CNS 12865-3
1991 Edition Method of Test for Digital Microelectronics ( Low Level Input Current ) 數位微電子檢驗法（低位準輸入電流） |
|
|
|
CNS 12865-4
1991 Edition Method of Test for Digital Microelectronics ( High Level Input Current ) 數位微電子檢驗法（高位準輸入電流） |
|
|
|
CNS 12865-5
1991 Edition Method of Test for Digital Microelectronics ( Output Short Circuit Current ) 數位微電子檢驗法（輸出端短路電流） |
|
|
|
CNS 12865-6
1991 Edition Method of Test for Digital Microelectronics ( Terminal Capacitance ) 數位微電子檢驗法（端子電容值） |
|
|
|
CNS 12865-7
1991 Edition Method of Test for Digital Microelectronics ( Drive Source, Dynamic ) 數位微電子檢驗法（驅動源，動態） |
|
|
|
CNS 12865-8
1991 Edition Method of Test for Digital Microelectronics ( Load Condition ) 數位微電子檢驗法（負載條件） |
|
|
|
CNS 12865-9
1991 Edition Method of Test for Digital Microelectronics ( Delay Measurements ) 數位微電子檢驗法（延遲量測） |
|
|
|
CNS 12865-1
1991 Edition Method of Test for Digital Microelectronics ( High Level Output Voltage ) 數位微電子檢驗法（高位準輸出電壓） |
|
| Find out:25Items | To Page of: First -Previous-Next -Last | 1 |
