"Probe" CNS Standards List |
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CNS 15044
2018 Edition Standard specification for clinical thermometer Probe covers and sheaths 體溫計探針護套 |
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CNS 7664
2017 Edition Method of Test for Low Frequency (Below 3 MHz)Electrical Connectors (TP - 25 Probe Damage Test) 頻率３ＭＨｚ以下電連接器檢驗法（探針損壞試驗ＴＰ–２５） |
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CNS 12846
2017 Edition Helium Mass Spectrometer Leak Testing by Trace Probe Method 氦質譜儀示蹤氣探針探漏法 |
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CNS 13213
2017 Edition Probes 對矽晶光電元件之電流電壓特性測量值做溫度與輻射校正之程序 |
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CNS 15748-6
2015 Edition Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic Probe method 積體電路－150 kHz 至1 GHz 電磁放射量測－第6 部：傳導放射量測－磁場探棒法 |
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CNS 15748-6
2015 Edition Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic Probe method 積體電路－150 kHz至1 GHz電磁放射量測－第6部：傳導放射量測－磁場探棒法 |
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CNS 12846
1991 Edition Helium Mass Spectrometer Leak Testing by Trace Probe Method 氦質譜儀示蹤氣探針探漏法 |
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CNS 7664
1987 Edition Method of Test for Low Frequency (Below 3 MHz)Electrical Connectors (TP - 25 Probe Damage Test) 頻率3 MHz以下電連接器檢驗法(探針損壞試驗TP-25) |
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