"Semiconductor" CNS Standards List |
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CNS 13802-5
2021 Edition Graphical Symbols for Diagrams (Semiconductors and Electron Tubes) 電機工程製圖符號（半導體及電子管） |
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CNS 15187-4
2019 Edition Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of Semiconductor devices 低壓熔線－第４部︰半導體裝置保護用熔線鏈之補充規定 |
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CNS 15187-4-1
2019 Edition Low-voltage fuses - Part 4-1: Supplementary requirements for fuse-links for the protection of Semiconductor devices - Sections I to III : Examples of types of standardized fuse-links 低壓熔線－第４－１部︰半導體裝置保護用熔線鏈之補充規定－第Ｉ章至第ＩＩＩ章︰經標準化之熔線鏈各種類型範例 |
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CNS 6127
2017 Edition General Rules for Reliability Assured Discrete Semiconductor Devices 可靠度保證單件半導體裝置總則 |
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CNS 13623
2017 Edition Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method) 單晶片之電阻率、霍爾係數及霍爾移動率之測定法（范德普法） |
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CNS 11900
2017 Edition Fixed Ceramic Capacitors for Electronic Equipment (Semiconductor) 電子設備用陶瓷固定電容器（半導體） |
Translated |
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CNS 13805
2017 Edition Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers 光電半導體晶圓之光激光譜量測法 |
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CNS 6137
2017 Edition Color Coding of Discrete Semiconductor Devices 個別半導體元件之色碼 |
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CNS 13805
1997 Edition Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers 光電半導體晶圓之光激光譜量測法 |
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CNS 13623
1995 Edition Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method) 單晶片之電阻率、霍爾係數及霍爾移動率之測定法（范德普法） |
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CNS 6137
1988 Edition Color Coding of Discrete Semiconductor Devices 個別半導體元件之色碼 |
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CNS 11900
1987 Edition Fixed Ceramic Capacitors for Electronic Equipment (Semiconductor) 電子設備用陶瓷固定電容器（半導體） |
Translated |
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CNS 6127
1986 Edition General Rules for Reliability Assured Discrete Semiconductor Devices 可靠度保證單件半導體裝置總則 |
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