"electronics" CNS Standards List |
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CNS 61881-3
2021 Edition Railway applications − Rolling stock equipment − Capacitors for power electronics − Part 3: Electric double-layer capacitors 鐵路應用－鐵路車輛設備－電力電子之電容器－第3部：電雙層電容器 |
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CNS 14881
2019 Edition Pliers and nippers for electronics - General technical requirements 電子用夾鉗與剪鉗試驗法 |
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CNS 9384
2019 Edition Method of Test for Multi - Connectors Use in electronics and Waterproof for Automotives 汽車電子用及防水用多根接頭試驗法 |
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CNS 9383
2019 Edition Multi - Connectors Use in electronics and Waterproof for Automotives 汽車電子用及防水用多根接頭 |
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CNS 14879
2019 Edition Pliers and nippers for electronics - Methods of test 電子用夾鉗與剪鉗詞彙 |
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CNS 14883
2019 Edition Pliers and nippers for electronics - Single-purpose cutting nippers 電子用夾鉗與剪鉗－單功能夾鉗 |
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CNS 14882
2019 Edition Pliers and nippers for electronics - Nomenclature 電子用夾鉗與剪鉗—單功能剪鉗 |
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CNS 12865-4
2017 Edition Method of Test for Digital Microelectronics ( High Level Input Current ) 數位微電子檢驗法（高位準輸入電流） |
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CNS 12865-7
2017 Edition Method of Test for Digital Microelectronics ( Drive Source, Dynamic ) 數位微電子檢驗法（驅動源，動態） |
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CNS 12865-3
2017 Edition Method of Test for Digital Microelectronics ( Low Level Input Current ) 數位微電子檢驗法（低位準輸入電流） |
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CNS 12865-10
2017 Edition Method of Test for Digital Microelectronics (Functional Testing) 數位微電子檢驗法（功能測試） |
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CNS 12865-5
2017 Edition Method of Test for Digital Microelectronics ( Output Short Circuit Current ) 數位微電子檢驗法（輸出端短路電流） |
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CNS 12865-8
2017 Edition Method of Test for Digital Microelectronics ( Load Condition ) 數位微電子檢驗法（負載條件） |
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CNS 12865-1
2017 Edition Method of Test for Digital Microelectronics ( High Level Output Voltage ) 數位微電子檢驗法（高位準輸出電壓） |
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CNS 12865-6
2017 Edition Method of Test for Digital Microelectronics ( Terminal Capacitance ) 數位微電子檢驗法（端子電容值） |
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CNS 12865-2
2017 Edition Method of Test for Digital Microelectronics ( Low Level Output Voltage ) 數位微電子檢驗法（低位準輸出電壓） |
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CNS 12865-9
2017 Edition Method of Test for Digital Microelectronics ( Delay Measurements ) 數位微電子檢驗法（延遲量測） |
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CNS 12865-10
1992 Edition Method of Test for Digital Microelectronics (Functional Testing) 數位微電子檢驗法（功能測試） |
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CNS 12865-8
1991 Edition Method of Test for Digital Microelectronics ( Load Condition ) 數位微電子檢驗法（負載條件） |
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CNS 12865-4
1991 Edition Method of Test for Digital Microelectronics ( High Level Input Current ) 數位微電子檢驗法（高位準輸入電流） |
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CNS 12865-7
1991 Edition Method of Test for Digital Microelectronics ( Drive Source, Dynamic ) 數位微電子檢驗法（驅動源，動態） |
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CNS 12865-6
1991 Edition Method of Test for Digital Microelectronics ( Terminal Capacitance ) 數位微電子檢驗法（端子電容值） |
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CNS 12865-5
1991 Edition Method of Test for Digital Microelectronics ( Output Short Circuit Current ) 數位微電子檢驗法（輸出端短路電流） |
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CNS 12865-1
1991 Edition Method of Test for Digital Microelectronics ( High Level Output Voltage ) 數位微電子檢驗法（高位準輸出電壓） |
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CNS 12865-2
1991 Edition Method of Test for Digital Microelectronics ( Low Level Output Voltage ) 數位微電子檢驗法（低位準輸出電壓） |
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CNS 12865-3
1991 Edition Method of Test for Digital Microelectronics ( Low Level Input Current ) 數位微電子檢驗法（低位準輸入電流） |
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CNS 12865-9
1991 Edition Method of Test for Digital Microelectronics ( Delay Measurements ) 數位微電子檢驗法（延遲量測） |
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