"kHz" CNS Standards List |
|
CNS 15329-2
2021 Edition Information technology − Radio frequency identification device conformance test methods − Part 2: Test methods for air interface communications below 135 kHz 資訊技術－無線射頻識別裝置符合性測試方法－第2 部：低於135 kHz空中介面通信之測試方法 |
|
|
|
CNS 15748-4
2019 Edition Integrated Circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method 積體電路－150 kHz 至1 GHz 電磁放射量測－第4 部：傳導放射量測－1Ω/150Ω直接耦合法積體電路－150 kHz 至1 GHz 電磁放射量測－第4 部：傳導放射量測－1Ω/150Ω直接耦合法 |
|
|
|
CNS 15748-5
2019 Edition Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 5: Measurement of conducted emissions – Workbench Faraday Cage method 積體電路－150 kHz 至1 GHz 電磁放射量測－第5 部：傳導放射量測－工作台法拉第箱體法 |
|
|
|
CNS 15748-3
2019 Edition Integrated circuits − Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 3: Measurement of radiated emissions – Surface scan method 積體電路－150 kHz 至1 GHz 電磁放射量測－第3 部：輻射放射量測－表面掃描法 |
|
|
|
CNS 15748-2
2019 Edition Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz − Part 2: Measurement of radiated emissions − TEM cell and wideband TEM cell method 積體電路－ 150 kHz 至1 GHz 電磁放射量測－第2 部： 輻射放射量測－ 橫向電磁波室與寬頻橫向電磁波室法 |
|
|
|
CNS 15748-1
2019 Edition Integrated circuits − Measurement of electromagnetic emissions, 150 kHz to 1 GHz − Part 1: General conditions and definitions 積體電路－150 kHz 至1 GHz 電磁放射量測－第1 部：一般條件及定義 |
|
|
|
CNS 14201
2018 Edition 7 kHz audio-coding within 64 KBIT/S 64 kbps 以內之 7kHz 音訊編碼 |
|
|
|
CNS 15210-2
2017 Edition Information technology - Radio frequency identification for item management - Part 2: Parameters for air interface communications below 135kHz 資訊技術－品項管理之無線射頻識別－第２部：低於１３５ｋＨｚ空中介面通信參數 |
|
|
|
CNS 12254
2017 Edition Quartz Crystal Units for Oscillators (for 200-1000 kHz) 振盪器用石英振盪晶體（２００ＫＨｚ～１０００ＫＨｚ用） |
|
|
|
CNS 15748-6
2015 Edition Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method 積體電路－150 kHz 至1 GHz 電磁放射量測－第6 部：傳導放射量測－磁場探棒法 |
|
|
|
CNS 15811-4
2015 Edition Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method 積體電路－ 150 kHz 至1 GHz 電磁抗擾度量測－ 第4 部： 射頻功率直接注入法 |
|
|
|
CNS 15811-5
2015 Edition Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 5: Workbench Faraday cage method 積體電路－ 150 kHz 至1 GHz 電磁抗擾度量測－ 第5 部： 工作台法拉第箱體法 |
|
|
|
CNS 15811-1
2015 Edition Intergrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 1: General conditions and definitions 積體電路－ 150 kHz 至1 GHz 電磁抗擾度量測－ 第1 部： 一般條件及定義 |
|
|
|
CNS 15811-3
2015 Edition Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 3: Bulk current injection (BCI) method 積體電路－150 kHz 至1 GHz 電磁抗擾度量測－第3 部：大電流注入法 |
|
|
|
CNS 15811-2
2015 Edition Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 2: Measurement of radiated immunity − TEM cell and wideband TEM cell method 積體電路－150 kHz 至1 GHz 電磁抗擾度量測－第2 部：輻射抗擾度量測－橫向電磁波室與寬頻橫向電磁波室法 |
|
|
|
CNS 15811-5
2015 Edition Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 5: Workbench Faraday cage method 積體電路－150 kHz至1 GHz電磁抗擾度量測－第5部：工作台法拉第箱體法 |
|
|
|
CNS 15748-6
2015 Edition Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method 積體電路－150 kHz至1 GHz電磁放射量測－第6部：傳導放射量測－磁場探棒法 |
|
|
|
CNS 15811-1
2015 Edition Intergrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 1: General conditions and definitions 積體電路－150 kHz至1 GHz電磁抗擾度量測－第1部：一般條件及定義 |
|
|
|
CNS 15811-2
2015 Edition Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 2: Measurement of radiated immunity − TEM cell and wideband TEM cell method 積體電路－150 kHz至1 GHz電磁抗擾度量測－第2部：輻射抗擾度量測－橫向電磁波室與寬頻橫向電磁波室法 |
|
|
|
CNS 15811-3
2015 Edition Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 3: Bulk current injection (BCI) method 積體電路－150 kHz至1 GHz電磁抗擾度量測－第3部：大電流注入法 |
|
|
|
CNS 15811-4
2015 Edition Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method 積體電路－150 kHz至1 GHz電磁抗擾度量測－第4部：射頻功率直接注入法 |
|
|
|
CNS 12254
1988 Edition Quartz Crystal Units for Oscillators (for 200-1000 kHz) 振盪器用石英振盪晶體(200 MHz～1000 MHz用) |
|
| Find out:22Items | To Page of: First -Previous-Next -Last | 1 |
