Àô²y¼Ð·Çºô-CNS¼Ð·Ç¸Ñ¨M¤§¹D¡I | ­º­¶ | µn¿ý | µù¥U | Ápô§Ú­Ì | English |
¡¡ ¡¡

Chinese National Standards
中華民國國家標準
- Taiwan 台灣 -
¡@

"TP " CNS ¼Ð·Ç²M³æ

| ºÞ¨î¹Ï¡Ð | »É¤Î»É¦X | ¤ÆùÛ´Ö | ÅKÄq¥Û¡X | ¤Æ¾Ç¸ÕÃÄ | §ë¼vÀË´ú | ¨T¨®¤ÞÀº | ¤£µ²²y¸± | ¸ê°T§Þ³N | ªQ­»ªoÀË |

C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 11905:2017 - ­^¤åª©
¥úÅָ˸mÀËÅçªk¡]¥úÆl¦Ü³s±µ¾¹¤§¶b¦VÀ£¤O­t¸ü¢Ô¢Ý¢â¢Þ¡V¢·¢²¡^
Method of Test for Fiber Optic Devices (FOTP-83 Cable to Interconnecting Device Axial Compressive Loading) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 11788:2017 - ­^¤åª©
¥úÅÖ²Õ¥óÀËÅçªk¡]§C·Å¤Î°ª·ÅÅs¦±¸ÕÅç¢Ô¢Ý¢â¢Þ¡V¢²¢¶¡^
Method of Test for Fiber Optic Devices (FOTP-37 Cable Bend Test Low and High Temperature) - English Version
X-¸ê°T¤Î³q«H
CNS 15427:2017 - ­^¤åª©
¸ê°T§Þ³N¡Ð¦w¥þ§Þ³N¡Ð¤ä´©¼Æ¦ìñ³¹À³¥Î¤§¨ü«H¿à²Ä¤T¤èªA°È³W®æ
Information technology - Security techniques - Specification of TTP services to support the application of digital signatures - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 8222:2017 - ­^¤åª©
ÀW²v¢²¢Û¢Ö£C¥H¤U¹q³s±µ¾¹ÀËÅçªk¡]ªîÀ£¸ÕÅç¢â¢Þ¡V¢³¢¯¡^
Method of Test for Low Frequency (Below 3 MHz) Electrical Connector (TP - 40 Crush Test) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 12368:2017 - ­^¤åª©
¥úÅָ˸mÀËÅçªk¡]§é®g²v®|¦V¤À¥¬¹Ï¡A¥ú§é®g²v¢Ô¢Ý¢â¢Þ¡V¢³¢³¡^
Method of Test for Fiber Optic Devices ( FOTP-44 Refractive Index Profile, Refracted Ray Method) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 8217:2017 - ­^¤åª©
ÀW²v¢²¢Û¢Ö£C¥H¤U¹q³s±µ¾¹ÀËÅçªk¡]¯S©w¯ß½Ä¾÷±ñ½ÄÀ»¸ÕÅç¢â¢Þ¡V¢±¢¶¡^
Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 27 Mechanical Shock Specified Pulse) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 11706:2017 - ­^¤åª©
¥úÅÖ²Õ¥óÀËÅçªk¡]¿é¥X»·³õ©ñ®g¹Ï«¬¤§´ú¶q¢Ô¢Ý¢â¢Þ¡V¢³¢¶¡^
Method of Test for Fiber Optic Devices (FOTP-47 Output Far-Field Radiation Pattern Measurement) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 8223:2017 - ­^¤åª©
ÀW²v¢²¢Û¢Ö£C¥H¤U¹q³s±µ¾¹ÀËÅçªk¡]¶ê§ÎÅ@®M¹qÆl¥i¼¸©Ê¸ÕÅç¢â¢Þ¡V¢³¢°¡^
Method of Test for Low Frequency (Below 3 MHz) Electrical Connector (TP - 41 Circular Jacket Cable Flexing Test) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 8221:2017 - ­^¤åª©
ÀW²v¢²¢Û¢Ö£C¥H¤U¹q³s±µ¾¹ÀËÅçªk¡]¼ö¾_¸ÕÅç¢â¢Þ¡V¢²¢±¡^
Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 32 Thermal Shock Test ) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 12360:2017 - ­^¤åª©
¥úÅָ˸mÀËÅçªk¡]²GÅé®ûº{¸ÕÅç¢Ô¢Ý¢â¢Þ¡V¢¶¢´¡^
Method of Test for Fiber Optic Devices ( FOTP-75 Fluid Immersion Test) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 7658:2017 - ­^¤åª©
ÀW²v¢²¢Û¢Ö£C¥H¤U¹q³s±µ¾¹ÀËÅçªk¡]±²ÁYºÝ¤l¤§§Ü©Ô±j«×¢â¢Þ¡V¢·¡^
Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 8 Crimp Tensile Strength) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 7659:2017 - ­^¤åª©
ÀW²v¢²¢Û¢Ö£C¥H¤U¹q³s±µ¾¹ÀËÅçªk¡]­@À£ÀËÅç¢â¢Þ¡V¢±¢¯¡^
Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 20 with Standing Voltage Test) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 11904:2017 - ­^¤åª©
¥úÅָ˸mÀËÅçªk¡]¦³¶ñ¥Rª«¥úÆl¤§¤Æ¦Xª«ºwº|¸ÕÅç¢Ô¢Ý¢â¢Þ¡V¢·¢°¡^
Method of Test for Fiber Optic Devices (FOTP-81 Compound Flow (Drip) Test for Filled Fiber Optic Cable) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 8220:2017 - ­^¤åª©
ÀW²v¢²¢Û¢Ö£C¥H¤U¹q³s±µ¾¹ÀËÅçªk¡]­@Àã©Ê¸ÕÅç¢â¢Þ¡V¢²¢°¡^
Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 31 Humidity Test ) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 8216:2017 - ­^¤åª©
ÀW²v¢²¢Û¢Ö£C¥H¤U¹q³s±µ¾¹ÀËÅçªk¡]ðS¤ô¼QÃú»G»k¸ÕÅç¢â¢Þ¡V¢±¢µ¡^
Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 26 Salt Spray Corrosion Test) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 11906:2017 - ­^¤åª©
¥úÅָ˸mÀËÅçªk¡]¥úÆl³QÂЦÛÂH©Ê¸ÕÅç¢Ô¢Ý¢â¢Þ¡V¢·¢³¡^
Method of Test for Fiber Optic Devices (FOTP-84 Jacket Self-Adhesion (Blocking) Test for Fiber Optic Cable) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 7660:2017 - ­^¤åª©
ÀW²v¢²¢Û¢Ö£C¥H¤U¹q³s±µ¾¹ÀËÅçªk¡]µ´½t¹qªý¢â¢Þ¡V¢±¢°¡^
Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 21 Insulation Resistance) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 11334:2017 - ­^¤åª©
¥úÅָ˸mÀËÅçªk¡]¥úÆlµ²¸ÕÅç¢Ô¢Ý¢â¢Þ¡V¢·¢¶¡^
Method of Test for Fiber Optic Devices (FOTP-87 Fiber Optic Cable Knot Test) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 7657:2017 - ­^¤åª©
ÀW²v¢²¢Û¢Ö£C¥H¤U¹q³s±µ¾¹ÀËÅçªk¡]±²ÁYºÝ¤l¤§Åܧ΢â¢Þ¡V¢¶¡^
Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 7 Crimp Contact Deformation) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 11789:2017 - ­^¤åª©
¥úÅÖ²Õ¥óÀËÅçªk¡]ªø¶ZÂ÷±×®g²v¥úÅÖ¤§¥úÃаI´î´ú¶q¢Ô¢Ý¢â¢Þ¡V¢³¢µ¡^
Method of Test for Fiber Optic Devices (FOTP-46 Spectral Attenuation Measurement for Long-Length, Graded-Index Optical Fibers) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 10927:2017 - ­^¤åª©
¥úÅָ˸mÀËÅçªk¡]¥úÅ֧ܱj©Ô«×´ú¶qªk¢Ô¢Ý¢â¢Þ¡V¢±¢·¡^
Method of Test for Fiber Optic Devices (FOTP-28 Measuring Failure Point of Optical Waveguide Fiber) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 9238:2017 - ­^¤åª©
ÀW²v¢²¢Û¢Ö£C¥H¤U¹q³s±µ¾¹ÀËÅçªk¡]­@¥Î¸ÕÅç¢â¢Þ¡V¢¸¡^
Method of Test for Low Frequency(Below 3 MHz) Electrical Connectors(TP- 9 Durability) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 11907:2017 - ­^¤åª©
¥úÅָ˸mÀËÅçªk¡]¯SºØ¥Î³~¥úÆl¤§¤õµK¸ÕÅç¢Ô¢Ý¢â¢Þ¡V¢¸¢¸¡^
Method of Test for Fiber Optic Devices (FOTP-99 Gas Flame Test for Special Purpose Fiber Optic Cable) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 8218:2017 - ­^¤åª©
ÀW²v¢²¢Û¢Ö£C¥H¤U¹q³s±µ¾¹ÀËÅçªk¡]®¶°Ê¸ÕÅç¢â¢Þ¡V¢±¢·¡^
Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 28 Vibration Test ) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 9128:2000 - ­^¤åª©
²î¥Î600 V¤T¤ßEPRµ´½tPVC³QÂЪ÷ÄݺôñZ¸Ë¹qÆl(600 V-TPYC)¤Î600 V¤T¤ßEPRµ´½tPVC³QÂЪ÷ÄݺôñZ¸ËPVC¨¾»k¹qÆl(600 V-TPYCY)
660V Three-core EPR insulated PVC sheathed metal netting covered cable(660V-TPYC)and 660V three-core EPR insulated PVC sheathed metal netting covered PVC anti-corrosion cable (660V-TPYCY)for marine use - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 6135-9:2000 - ­^¤åª©
§UÅ¥¾¹¡Ð²Ä9³¡¡G¥Î°©¾É®¶°Ê¾¹¿é¥X¤§§UÅ¥¾¹©Ê¯à¯S©Êªº¶q´ú
Hearing aids - Part 9: Measurement of characteristics of hearing aids with bone vibrator output - English Version
Z-#N/A
CNS 13942:1997 - ­^¤åª©
·LÁY§Þ³N¡Ð¹q¸£¿é¥X·LÁY³æ¤ù(COM)-A6«¬·LÁY³æ¤ù
Micrographics-Computer output microfiche (COM)-Microfiche A6 - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 12865-2:1991 - ­^¤åª©
¼Æ¦ì·L¹q¤lÀËÅçªk¡]§C¦ì·Ç¿é¥X¹qÀ£¡^
Method of Test for Digital Microelectronics ( Low Level Output Voltage ) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 12865-5:1991 - ­^¤åª©
¼Æ¦ì·L¹q¤lÀËÅçªk¡]¿é¥XºÝµu¸ô¹q¬y¡^
Method of Test for Digital Microelectronics ( Output Short Circuit Current ) - English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 12865-1:1991 - ­^¤åª©
¼Æ¦ì·L¹q¤lÀËÅçªk¡]°ª¦ì·Ç¿é¥X¹qÀ£¡^
Method of Test for Digital Microelectronics ( High Level Output Voltage ) - English Version

§ä¨ì:213±ø¥Ø   |  [­º­¶]-[¤W¤@­¶]-[¤U¤@­¶]-[§À­¶]  | ¥h¨ì: 1 2 3 4 5 6 7 8

¡@

| ­º­¶ | ±`¨£°ÝÃD | µn¿ý | µù¥U | Ápô§Ú­Ì | English | ©  CNS-standards.org   2001-2025 ª©Åv©Ò¦³
¥DºÞ¾÷Ãö³sµ²:
¸gÀÙ³¡¼Ð·ÇÀËÅç§½
¥»ºô¯¸«DÁõÄÝ©ó¸gÀÙ³¡¼Ð·ÇÀËÅç§½