"Electrical Engineering " CNS Standards List |
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CNS 13808:2017
- English Version Epitaxial Wafers for Light Emitting Diodes 發光二極體磊晶片 - 英文版 |
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CNS 11762:2017
- English Version Environmental Requirements for Electronic Equipments 電子設備之使用環境條件 - 英文版 |
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CNS 12246:2017
- English Version Method of Test for Oil-Soluble 100% Phenolic Resins of Electricals Insulating 電絕緣塗料用１００％油溶性酚樹脂試驗法 - 英文版 |
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CNS 13790:2017
- English Version Measuring Methods of Fiber Optical Branching Components for Communication 通信用光分歧元件量測法 - 英文版 |
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CNS 10899:2017
- English Version Method of Test for Flat Quick-Connect Terminals 平板型接頭檢驗法 - 英文版 |
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CNS 10874:2017
- English Version Method of Test for Fiber Optic Devices ( FOTP-18 Acceleration ) 光纖裝置檢驗法（加速度試驗ＦＯＴＰ–１８） - 英文版 |
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CNS 407:2017
- English Version Symbols of Transformers 變壓器符號 - 英文版 |
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CNS 7130:2017
- English Version Vibration Level Meters 振動位準計 - 英文版 |
Translated |
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CNS 12082:2017
- English Version Method of Test for Fiber Optic Devices (FOPT-30 Frequency Domain Measurement of Multimode Optical Fiber Information Transmission Capacity) 光纖裝置檢驗法（多模光纖資訊傳輸量之頻域測量ＦＯＴＰ–３０） - 英文版 |
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CNS 6014:2017
- English Version Standard Definitions of Terms Relating to Electric Insulation 電絕緣相關名詞釋義 - 英文版 |
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CNS 13059-9:2017
- English Version Photovoltaic devices Part 9: Solar simulator performance requirements 光電伏打元件（第九部：太陽模擬器之性能要求） - 英文版 |
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CNS 2933:2017
- English Version Electric Radiators 電暖器 - 英文版 |
Translated |
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CNS 6147:2017
- English Version Method of Test for Electromechanical Switches(Switch Resistance) 電機開關檢驗法–開關電阻值 - 英文版 |
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CNS 11575:2017
- English Version Method of Test for Low Frequency (Below 3MHz) Electrical Connectors (TP-55 Current Cycling Test) 頻率３ＭＨｚ以下電連接器檢驗法（電流循環試驗ＴＰ–５５） - 英文版 |
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CNS 12288:2017
- English Version General Rules for Reliability Assured Fixed Metal Film Resistors 可靠度保證金屬皮膜固定電阻器總則 - 英文版 |
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CNS 6083:2017
- English Version Lock Nuts for Rigid Steel Conduits 電線用鋼管鎖帽 - 英文版 |
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CNS 13623:2017
- English Version Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method) 單晶片之電阻率、霍爾係數及霍爾移動率之測定法（范德普法） - 英文版 |
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CNS 12257:2017
- English Version Crystal Filters 晶體濾波器 - 英文版 |
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CNS 13781:2017
- English Version Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias) 自動控制用紅外發光二極體耐久性試驗法–預燒試驗（順向偏壓） - 英文版 |
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CNS 8793:2017
- English Version Method of Test for Combustion Resistance of Heat Shrinkable Tubing for Electrical Insulation 電絕緣用熱收縮套管耐燃性試驗法 - 英文版 |
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