CNS 7094 Standard english version summary

CNS	Chinese National Standard	General No.	CNS7094
		Classified No.	Z8017
Method of Micro - Hardness Test for Vickers and Knoop Hardness 維克氏及諾布氏顯微鏡下硬度試驗法
Date of Approval	Bureau of Standards, Metrology and Inspection	Date of Revision

Thanks for your interest in "CNS 7094" standard !
1. If you only need this CNS7094 standard, you can pay directly on this page,
2. If you have more standards need to purchase, you can log in to the Member Center, put it in the shopping cart, and pay them together.

Add to cart

CNS Standard Code	CNS 7094
CNS Standard English Title	Method of Micro - Hardness Test for Vickers and Knoop Hardness
CNS Standard Chinese Title	維克氏及諾布氏顯微鏡下硬度試驗法
CNS Standard Classified No.	Z8017 - General & Miscellaneous
CNS Standard Status	Status：Current; Latest date：07/11/1983 Confirmed date：11/19/2021
Chinese Version Pages	3
Chinese Version Price	$***.00 USD
English Version	Translate after your order
English Translation Price	$.00* USD
Translation Time	About 5 Work Days


* Order Items
* Payment Amount	USD
* Email
	How to pay by credit or debit card?

Relational CNS standards of CNS 7094 Keyword: Method Micro Hardness Test Vickers Knoop Hardness ...

Standard Code	Standard Title
CNS 12865-7:2017	Method of Test for Digital Microelectronics ( Drive Source, Dynamic )
CNS 12865-4:2017	Method of Test for Digital Microelectronics ( High Level Input Current )
CNS 15685:2019	Method of test for grain size of coated abrasive microgrits (P240-P2500)
CNS 12865-3:2017	Method of Test for Digital Microelectronics ( Low Level Input Current )
CNS 12865-10:2017	Method of Test for Digital Microelectronics (Functional Testing)
CNS 12865-8:2017	Method of Test for Digital Microelectronics ( Load Condition )
CNS 12865-5:2017	Method of Test for Digital Microelectronics ( Output Short Circuit Current )
CNS 12865-1:2017	Method of Test for Digital Microelectronics ( High Level Output Voltage )
CNS 12865-6:2017	Method of Test for Digital Microelectronics ( Terminal Capacitance )
CNS 12865-2:2017	Method of Test for Digital Microelectronics ( Low Level Output Voltage )
	>>>

Order Process Chart

Free sign up a member account, Log in the Member Center.

Lookup the Standards you want to order.

Add Standards in Shopping Cart, you can add or delete standards in the Shopping Cart before you submit the Price Inquiry

The Price Inquiry of the Standards order in your shopping cart will Submit to us automatically, We will quote within 24 hours. If in china work time, usually in 2 hr.

Before Check out, you can delete the Standards you don't want to buy, then make the payment.

Waiting for our Translation, the time is depend on the Standards pages, usually need 1 week.

Download Standards PDF Files in this system or Sent to your email

��	��
Chinese National Standards 中華民國國家標準 - Taiwan 台灣 -