CNS 15811-4 Standard english version summary

CNS	Chinese National Standard	General No.	CNS15811-4
		Classified No.	C6457-4
Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method 積體電路－150 kHz至1 GHz電磁抗擾度量測－第4部：射頻功率直接注入法
Date of Approval	Bureau of Standards, Metrology and Inspection	Date of Revision

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CNS Standard Code	CNS 15811-4
CNS Standard English Title	Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method
CNS Standard Chinese Title	積體電路－150 kHz至1 GHz電磁抗擾度量測－第4部：射頻功率直接注入法
CNS Standard Classified No.	C6457-4 - Electrical Engineering
CNS Standard Status	Current; Latest date：10/19/2015
Chinese Version Pages	19
Chinese Version Price	$***.00 USD
English Version	Translate after your order
English Translation Price	$.00* USD
Translation Time	About 5 Work Days


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Relational CNS standards of CNS 15811-4 Keyword: Integrated circuits − Measurement electromagnetic immunity − 150 kHz ...

Standard Code	Standard Title
CNS 15748-4:2019	Integrated Circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method
CNS 15748-5:2019	Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 5: Measurement of conducted emissions – Workbench Faraday Cage method
CNS 15748-6:2015	Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method
CNS 15811-4:2015	Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method
CNS 15748-3:2019	Integrated circuits − Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 3: Measurement of radiated emissions – Surface scan method
CNS 15811-5:2015	Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 5: Workbench Faraday cage method
CNS 15748-2:2019	Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz − Part 2: Measurement of radiated emissions − TEM cell and wideband TEM cell method
CNS 15811-3:2015	Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 3: Bulk current injection (BCI) method
CNS 15748-1:2019	Integrated circuits − Measurement of electromagnetic emissions, 150 kHz to 1 GHz − Part 1: General conditions and definitions
CNS 15811-2:2015	Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 2: Measurement of radiated immunity − TEM cell and wideband TEM cell method
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